Method for characterizing x-ray detector materials using a Raman microscope
    1.
    发明授权
    Method for characterizing x-ray detector materials using a Raman microscope 有权
    使用拉曼显微镜表征X射线检测器材料的方法

    公开(公告)号:US07907274B2

    公开(公告)日:2011-03-15

    申请号:US12179265

    申请日:2008-07-24

    Applicant: Victor Mazzio

    Inventor: Victor Mazzio

    CPC classification number: G02B21/26 G02B21/24

    Abstract: An improved Raman microspectrometer system extends the optical reach and analysis range of an existing Raman microspectrometer to allow analysis and/or repair of an oversized sample. The improved Raman microspectrometer system includes an extender for extending the optical reach of the existing microspectrometer and a supplemental stage which extends the analysis range of the existing microspectrometer by providing travel capabilities for non-destructive analysis of an entire oversized sample. Such an arrangement decreases manufacturing costs associated with testing oversized samples such as mammography panels, enabling analysis and/or repair to be performed without destruction.

    Abstract translation: 改进的拉曼显微光谱仪系统扩展了现有拉曼显微光谱仪的光学范围和分析范围,以便对超大样品进行分析和/或修复。 改进的拉曼显微光谱仪系统包括扩展器,用于扩展现有显微光度计的光学范围,以及补充级,通过提供用于整个超大样本的非破坏性分析的行进能力来扩展现有微光谱仪的分析范围。 这样的布置降低了与测试超大样本(例如乳房X线照相面板)相关联的制造成本,使得能够进行分解和/或修复而不破坏。

    System and Device for Non-Destructive Raman Analysis
    2.
    发明申请
    System and Device for Non-Destructive Raman Analysis 审中-公开
    非破坏性拉曼分析系统和器件

    公开(公告)号:US20120268737A1

    公开(公告)日:2012-10-25

    申请号:US13541883

    申请日:2012-07-05

    Applicant: Victor Mazzio

    Inventor: Victor Mazzio

    Abstract: An improved Raman microspectrometer system extends the optical reach and analysis range of an existing Raman microspectrometer to allow analysis and/or repair of an oversized sample. The improved Raman microspectrometer system includes an extender for extending the optical reach of the existing microspectrometer and a supplemental stage which extends the analysis range of the existing microspectrometer by providing travel capabilities for non-destructive analysis of an entire oversized sample. Such an arrangement decreases manufacturing costs associated with testing oversized samples such as mammography panels, enabling analysis and/or repair to be performed without destruction.

    Abstract translation: 改进的拉曼显微光谱仪系统扩展了现有拉曼显微光谱仪的光学范围和分析范围,以便对超大样品进行分析和/或修复。 改进的拉曼显微光谱仪系统包括扩展器,用于扩展现有显微光度计的光学范围,以及补充级,通过提供用于整个超大样本的非破坏性分析的行进能力来扩展现有微光谱仪的分析范围。 这样的布置降低了与测试超大样本(例如乳房X线照相面板)相关联的制造成本,使得能够进行分解和/或修复而不破坏。

    System and Device for Non-Destructive Raman Analysis
    3.
    发明申请
    System and Device for Non-Destructive Raman Analysis 审中-公开
    非破坏性拉曼分析系统和器件

    公开(公告)号:US20100020393A1

    公开(公告)日:2010-01-28

    申请号:US12179251

    申请日:2008-07-24

    Applicant: Victor Mazzio

    Inventor: Victor Mazzio

    Abstract: An improved Raman microspectrometer system extends the optical reach and analysis range of an existing Raman microspectrometer to allow analysis and/or repair of an oversized sample. The improved Raman microspectrometer system includes an extender for extending the optical reach of the existing microspectrometer and a supplemental stage which extends the analysis range of the existing microspectrometer by providing travel capabilities for non-destructive analysis of an entire oversized sample. Such an arrangement decreases manufacturing costs associated with testing oversized samples such as mammography panels, enabling analysis and/or repair to be performed without destruction.

    Abstract translation: 改进的拉曼显微光谱仪系统扩展了现有拉曼显微光谱仪的光学范围和分析范围,以便对超大样品进行分析和/或修复。 改进的拉曼显微光谱仪系统包括扩展器,用于扩展现有显微光度计的光学范围,以及补充级,通过提供用于整个超大样本的非破坏性分析的行进能力来扩展现有微光谱仪的分析范围。 这样的布置降低了与测试超大样本(例如乳房X线照相面板)相关联的制造成本,使得能够进行分解和/或修复而不破坏。

    Method for Characterizing X-Ray Detector Materials Using a Raman Microscope
    4.
    发明申请
    Method for Characterizing X-Ray Detector Materials Using a Raman Microscope 有权
    使用拉曼显微镜表征X射线检测器材料的方法

    公开(公告)号:US20100020317A1

    公开(公告)日:2010-01-28

    申请号:US12179265

    申请日:2008-07-24

    Applicant: Victor Mazzio

    Inventor: Victor Mazzio

    CPC classification number: G02B21/26 G02B21/24

    Abstract: An improved Raman microspectrometer system extends the optical reach and analysis range of an existing Raman microspectrometer to allow analysis and/or repair of an oversized sample. The improved Raman microspectrometer system includes an extender for extending the optical reach of the existing microspectrometer and a supplemental stage which extends the analysis range of the existing microspectrometer by providing travel capabilities for non-destructive analysis of an entire oversized sample. Such an arrangement decreases manufacturing costs associated with testing oversized samples such as mammography panels, enabling analysis and/or repair to be performed without destruction.

    Abstract translation: 改进的拉曼显微光谱仪系统扩展了现有拉曼显微光谱仪的光学范围和分析范围,以便对超大样品进行分析和/或修复。 改进的拉曼显微光谱仪系统包括扩展器,用于扩展现有显微光度计的光学范围,并且通过提供用于整个超大样本的非破坏性分析的行进能力来扩展现有微光谱仪的分析范围的补充级。 这样的布置降低了与测试超大样本(例如乳房X线照相面板)相关联的制造成本,使得能够进行分解和/或修复而不破坏。

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