公开(公告)号：US11892353B2

公开(公告)日：2024-02-06

申请号：US17883724

申请日：2022-08-09

Applicant: SPECLIPSE, INC.

Inventor： Sung Hyun Pyun ,  Wan Ki Min

IPC: G01J3/30 ,  G01J3/443 ,  B63B25/16 ,  B63J2/14 ,  F02M21/02 ,  F17C6/00 ,  F17C9/02 ,  F17C9/04 ,  G01J3/42 ,  G01N21/71

CPC classification number: G01J3/443 ,  B63B25/16 ,  B63J2/14 ,  F02M21/0215 ,  F17C6/00 ,  F17C9/02 ,  F17C9/04 ,  F17C2221/033 ,  F17C2227/0164 ,  F17C2227/0185 ,  F17C2227/0339 ,  F17C2227/0348 ,  F17C2227/0358 ,  F17C2265/033 ,  F17C2265/034 ,  F17C2265/037 ,  F17C2265/038 ,  F17C2265/066 ,  F17C2270/0105 ,  G01J2003/423 ,  G01N21/718

Abstract: Disclosed herein are a method for diagnosing a disease of a body tissue by using LIBS (Laser-Induced Breakdown Spectroscopy) comprising: preparing a laser device including: a laser projection module, outputting the laser to a suspicious region of the body tissue, a light receiving module, receiving a plurality of light, a spectrum measurement module, and a guide unit; and projecting the laser to generate plasma by inducing tissue ablation in the suspicious region; wherein the laser projected to the suspicious region has a target area, and wherein the target area has smaller size than the suspicious region such that the target area is located inside the suspicious region.

公开(公告)号：US11446399B2

公开(公告)日：2022-09-20

申请号：US15733121

申请日：2018-11-20

Applicant: OPTIGGX INC.

Inventor： Marek Pacal ,  Jeremy Michael Sivak ,  Stefan Wilhelm ,  Desmond Fonn

IPC: G01J3/30 ,  A61K49/00 ,  A61B3/14

Abstract: A system for quantifying the presence of at least one chemical and/or a physical condition in ocular tissues is provided. The system uses a membrane having at least one photo-reactive chemical- and/or physical condition-sensing indicator dye and a photo-reactive reference dye wherein both the photo-reactive chemical- and/or physical condition-sensing indicator dye and the photo-reactive reference dye are responsive to the same wavelength of an excitation light source but emit different wavelengths of light in a light spectrum. An optical data detector receives the emitted light and a processor splits the data into two or more colours of the light spectrum and measures the intensity of the two or more colours. The colour intensity belonging to the emitted light from the chemical- and/or physical condition-sensing indicator dye is compared to the colour intensity of the light emitted from the reference dye and the amount of chemical present and/or the extent of physical condition is ratiometrically determined therefrom.

公开(公告)号：US20220268699A1

公开(公告)日：2022-08-25

申请号：US17647364

申请日：2022-01-07

Applicant: Universtiy of Virginia Patent Foundation

Inventor： Brooks Hart Pate

IPC: G01N21/3586 ,  G01N22/00 ,  H01J23/207 ,  G01J1/16 ,  G01J3/30 ,  H01J23/20 ,  G01J3/447

Abstract: A chiral molecule can be defined as a molecule that has a non-superimposable mirror image. These mirror images can be referred to as enantiomers. The enantiomers generally have the same set of bond lengths and bond angles in their three-dimensional geometry. Apparatus and techniques described herein can be used to perform analysis of chiral molecules using cavity-enhanced molecular rotational spectroscopy. A sample cell can define a resonant cavity, and a sample introduction port can provide pulse-jet injection of an analyte molecule and a chiral tag to allow analysis of a complex comprising the analyte and chiral tag.

公开(公告)号：US11073431B2

公开(公告)日：2021-07-27

申请号：US16678945

申请日：2019-11-08

Applicant: SIGMA LABS, INC.

Inventor： Vivek R. Dave ,  Mark J. Cola ,  R. Bruce Madigan ,  Martin S. Piltch ,  Alberto Castro

IPC: G01J3/30 ,  G01K13/00 ,  G01N21/71 ,  G01J3/28 ,  G01J3/443 ,  B22F10/20 ,  B33Y10/00 ,  B33Y30/00 ,  B33Y50/00 ,  B23K26/342 ,  B23K26/70 ,  B23K9/04 ,  B23K9/095 ,  B23K10/02 ,  B23K15/00 ,  B22F10/30

Abstract: An optical manufacturing process sensing and status indication system is taught that is able to utilize optical emissions from a manufacturing process to infer the state of the process. In one case, it is able to use these optical emissions to distinguish thermal phenomena on two timescales and to perform feature extraction and classification so that nominal process conditions may be uniquely distinguished from off-nominal process conditions at a given instant in time or over a sequential series of instants in time occurring over the duration of the manufacturing process. In other case, it is able to utilize these optical emissions to derive corresponding spectra and identify features within those spectra so that nominal process conditions may be uniquely distinguished from off-nominal process conditions at a given instant in time or over a sequential series of instants in time occurring over the duration of the manufacturing process.

公开(公告)号：US20210207994A1

公开(公告)日：2021-07-08

申请号：US17203038

申请日：2021-03-16

Applicant: Heraeus Noblelight America LLC ,  Heraeus Noblelight GmbH

Inventor： Brett Skinner ,  William C. Harper ,  Darrin Leonhardt ,  Ralf Dreiskemper

IPC: G01J1/44 ,  G01J3/30 ,  G01J1/04 ,  G01J3/02 ,  G01J1/02 ,  G01J1/42

Abstract: A system for measuring light in a tube is provided. The system includes a tube, a light collecting probe configured to absorb light within the tube, a data acquisition system for determining a level of light associated with light absorbed by the light collecting probe, and a motion system for moving the light collecting probe within the tube.

公开(公告)号：US11047802B2

公开(公告)日：2021-06-29

申请号：US16494821

申请日：2017-03-27

Applicant: SCHUNK KOHLENSTOFFTECHNIK GMBH ,  SHIMADZU CORPORATION

Inventor： Ralf Gaertner ,  Rudolf Weck ,  Akira Honda ,  Osuke Kobayashi

IPC: G01J3/30 ,  G01N21/74 ,  F27D11/02 ,  G01N21/31

Abstract: The invention relates to a tube furnace device for an atomizing furnace and to an analyzing apparatus comprising an atomizing furnace and a tube furnace device, in particular for atomic absorption spectrometry, the tube furnace device comprising a sample carrier means (11) and a bearing means (12) for supporting and forming electrical contact with the sample carrier means, the sample carrier means having a receiving tube (16) forming a tubular receiving space (17) for receiving an analyte, the sample carrier means having two bearing protrusions on the receiving tube for forming a connection with the bearing means, the bearing protrusions extending perpendicularly, preferably orthogonally, in relation to a longitudinal axis of the receiving tube, wherein the tube furnace device has a contact pressure means (13) via which a contact pressure force (14) can be exerted on the bearing protrusions in the direction of a passant line (20) in relation to a circular cross section (21) of the receiving tube.

公开(公告)号：US10935429B2

公开(公告)日：2021-03-02

申请号：US16536944

申请日：2019-08-09

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Kyeonghun Kim ,  Jeongil Mun ,  Hyung Joo Lee ,  Jongwoo Sun

IPC: G01J3/30 ,  G01J3/443 ,  H01J37/32 ,  G01J3/28

Abstract: A substrate processing module includes a process chamber configured to perform a treatment process on a substrate; a transfer chamber provided on a first side of the process chamber, the substrate being transferred between the process chamber and the transfer chamber; an optical emission spectroscopy (OES) system provided on a second side of the process chamber and configured to monitor the process chamber; and a reference light source disposed in the transfer chamber and configured to emit a reference light to calibrate the OES system.

公开(公告)号：US10830643B2

公开(公告)日：2020-11-10

申请号：US16592135

申请日：2019-10-03

Applicant: Hewlett-Packard Development Company, L.P.

Inventor： Francesco Aieta ,  Charles M. Santori ,  Anita Rogacs

IPC: G01J3/30 ,  G01N21/64 ,  G01N15/14 ,  G01J3/02 ,  G01J3/44 ,  G02B21/16 ,  G01J3/28 ,  G02B21/00 ,  G01N15/00 ,  G01N21/65 ,  G01N15/10

Abstract: In one implementation, a spectral microscope may comprise a substrate with a planar lens, the planar lens including a phase profile including an axial focus and an oblique focus, a light source to excite a signal of a particle among a plurality of particles, and a detector to receive light generated from the light source from the axial focus of the planar lens and a spectral color component of the excited signal of the particle from the oblique focus of the planar lens.

公开(公告)号：US10816402B2

公开(公告)日：2020-10-27

申请号：US16612469

申请日：2018-04-02

Applicant: HAMAMATSU PHOTONICS K.K.

Inventor： Kenichiro Ikemura ,  Kazuya Iguchi ,  Shigeru Eura ,  Akihiro Nakamura

IPC: G01J3/30 ,  G01J3/443 ,  G01J3/02

Abstract: A spectrometry device includes: an integrating sphere which includes an inner wall surface and an attachment hole; an adapter which includes a guide hole guiding the measurement target light and is disposed in the integrating sphere; a plate which includes a first surface covering the guide hole from the outside of the integrating sphere and allowing a sample to be mounted thereon and a second surface and through which the measurement target light is transmitted; a holder which includes a concave portion mounting the plate thereon and is attached to the attachment hole; and a spectral detector configured to detect the measurement target light. The concave portion includes a bottom surface facing the second surface and a side surface surrounding the periphery of the plate. The bottom surface and the side surface are coated with a reflective material reflecting the measurement target light.

公开(公告)号：US10801890B1

公开(公告)日：2020-10-13

申请号：US16539930

申请日：2019-08-13

Applicant: Applied Materials, Inc.

Inventor： Jinxin Fu ,  Yifei Wang ,  Ian Matthew McMackin ,  Rutger Meyer Timmerman Thijssen ,  Ludovic Godet

IPC: G01J3/30 ,  G01J3/18 ,  G02B7/04 ,  G01J3/02 ,  G01J3/42

Abstract: Embodiments of the present disclosure relate to measurement systems and methods for diffracting light. The measurement system includes a stage, an optical arm, and one or more detector arms. The method of diffracting light includes a method of diffracting light is provided, including projecting light beams having wavelength λlaser to a first zone of a first substrate at the fixed beam angle θ0 and the maximum orientation angle ϕmax, obtaining a displacement angle Δθ, determining a target maximum beam angle θt-max, wherein θt-max=θ0+Δθ, and determining a test grating pitch Pt-grating by a modified grating pitch equation Pt-grating=λlaser/(sin θt-max+sin θ0). The measurement system and method allow for measurement of nonuniform properties of regions of an optical device, such as grating pitches and grating orientations.