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公开(公告)号:US12146791B2
公开(公告)日:2024-11-19
申请号:US17597850
申请日:2020-07-30
Applicant: Thermo Fisher Scientific (Bremen) GmbH
Inventor: Tobias Wolf , Jan Rathkamp , Yannick Piero
Abstract: A sliding door assembly (50) for an inductively coupled plasma torch box (40) reduces the risk of heat related injuries and facilitates the handling of the torch box. The door assembly (50) comprises a door and a guiding mechanism (6) for allowing movement of the door in a first direction along an opening (45) of the torch box (40) so as to be able to open and close the torch box, and allowing movement of the door in a second direction, substantially perpendicular to the first direction, so as to move the door or at least a part thereof towards the opening when closing the torch box. The door may comprise an inner door panel interconnected with an outer door panel, so that only the inner door panel moves in the second direction, towards the opening (45) of the torch box (40) to tightly close it, while the outer door panel can maintain a safe temperature during operation.
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公开(公告)号:US12140478B2
公开(公告)日:2024-11-12
申请号:US17766184
申请日:2019-12-23
Applicant: Agilent Technologies, Inc.
Inventor: Daniel Finn McCarthy , Mark Andrew Woods
Abstract: The present invention is directed to a computer-implemented method of automatically identifying the presence of one or more elements in a sample via optical emission spectroscopy. The method includes the steps of obtaining sample spectrum data from the sample, obtaining a list of one or more predetermined emission wavelengths for each element in the periodic table quantifiable by optical emission spectroscopy, each predetermined emission wavelength being associated with a list of one or more potential interference emission wavelengths, determining a list of one or more analyte wavelengths corresponding to spectral peaks in the sample spectrum data based on the list of emission wavelengths, for each analyte wavelength, determining whether the corresponding spectral peak has a likelihood of being affected by an interference emission wavelength causing spectral interference based on the list of one or more potential interference emission wavelengths corresponding to the analyte wavelength, determining a revised list of one or more analyte wavelengths by removing from the list of analyte wavelengths, analyte wavelengths corresponding to spectral peaks having a likelihood of being affected by an interference emission wavelength, and determining a level of confidence that one or more elements are present in the sample based on a set of criteria applied to the revised list of analyte wavelengths.
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3.
公开(公告)号:US12072291B2
公开(公告)日:2024-08-27
申请号:US17292985
申请日:2019-11-14
Inventor: Volker Sturm
CPC classification number: G01N21/718 , G01J3/443 , G01N21/15 , G01N21/33 , G01N2021/151 , G01N2021/335
Abstract: A device may be provided for element analysis of materials by means of optical emission spectroscopy, particularly by means of laser-induced plasma spectroscopy, said device having: means for exciting a plasma from a partial quantity of a test sample made of the material to be analyzed; means for detecting and for spectral analysis of optical radiation emitted from the plasma; beam guidance means for guiding at least a part of the optical radiation emitted from the plasma to the means for detecting and spectral analysis; and means for flushing at least one partial region of the device with an inert gas, wherein the beam guidance means are at least one capillary tube, which additionally serves to guide the inert gas. A method may be provided for element analysis of materials by means of optical emission spectroscopy using the device.
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4.
公开(公告)号:US20240264146A1
公开(公告)日:2024-08-08
申请号:US18566380
申请日:2022-06-03
Applicant: Ricardo Daniel DE SIMONE
Inventor: Ricardo Daniel DE SIMONE
IPC: G01N33/497 , G01J3/443 , G01N1/44 , G01N21/67 , G06V10/774 , G06V20/69
CPC classification number: G01N33/4975 , G01J3/443 , G01N1/44 , G01N21/67 , G06V10/774 , G06V20/69
Abstract: The present invention relates to instruments and processes for detecting compounds in gas samples. In particular, for detecting health disorders from biological samples, more preferably for detecting diseases from breath samples of a mammal. It is included among the methods and instruments for the diagnosis of COVID-19.
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公开(公告)号:US12002185B2
公开(公告)日:2024-06-04
申请号:US17309027
申请日:2019-06-10
Applicant: Purdue Research Foundation
Inventor: Peiyi Zhang , Fang Huang , Sheng Liu
CPC classification number: G06T3/4046 , G01J3/2823 , G01J3/443 , G01N21/6428 , G01N21/6458 , G06N3/08
Abstract: A fluorescent single molecule emitter simultaneously transmits its identity, location, and cellular context through its emission patterns. A deep neural network (DNN) performs multiplexed single-molecule analysis to enable retrieving such information with high accuracy. The DNN can extract three-dimensional molecule location, orientation, and wavefront distortion with precision approaching the theoretical limit of information content of the image which will allow multiplexed measurements through the emission patterns of a single molecule.
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公开(公告)号:US11948774B2
公开(公告)日:2024-04-02
申请号:US17223941
申请日:2021-04-06
Applicant: Servomex Group Limited
Inventor: Bahram Alizadeh , Martin Lopez
CPC classification number: H01J37/32045 , G01J3/443 , G01N21/67 , G01N21/68 , H01J37/32018 , H01J37/32449 , H01J37/32926 , H01J37/32935 , H01J37/32981 , H05H1/0037 , H05H1/4697 , H01J37/32568 , H01J37/32972 , H01J37/3299 , H01J2237/334
Abstract: Methods and apparatus for determination of the gas composition of a sample gas using glow discharge optical emission spectroscopy, in which the method comprises: generating one or more oscillating electromagnetic fields within a plasma cell to excite particles within the cell, to produce a glow discharge plasma in the plasma cell, and controlling the operating conditions for the plasma cell while flowing a gas mixture through the plasma cell to maintain glow discharge optical emissions from the plasma within a desired operating range; and monitoring one or more glow discharge optical emissions from the plasma in the plasma cell by measuring the optical emissions, or measuring a signal that correlates with the optical emissions, at twice the plasma excitation frequency; and processing the signal during each excitation cycle of the electromagnetic excitation, to determine the concentration of a gas within a gas mixture flowing through the plasma cell.
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7.
公开(公告)号:US11940325B2
公开(公告)日:2024-03-26
申请号:US17870051
申请日:2022-07-21
Applicant: The Penn State Research Foundation
Inventor: Abdalla R. Nassar , Alexander J. Dunbar , Edward W. Reutzel
IPC: G01J3/02 , B22F10/20 , B22F10/25 , B22F10/28 , B22F12/44 , B22F12/45 , B22F12/90 , B33Y50/02 , G01J3/36 , G01J3/443 , B22F10/30 , B22F10/366 , B22F10/38 , B33Y10/00 , G01J3/12
CPC classification number: G01J3/36 , B22F10/20 , B22F10/25 , B22F10/28 , B22F12/44 , B22F12/45 , B22F12/90 , B33Y50/02 , G01J3/0208 , G01J3/443 , B22F10/30 , B22F10/366 , B22F10/38 , B33Y10/00 , G01J2003/1213
Abstract: Embodiments of the systems can be configured to receive electromagnetic emissions of a substrate (e.g., a build material of a part being made via additive manufacturing) by a detector (e.g., a multi-spectral sensor) and generate a ratio of the electromagnetic emissions to perform spectral analysis with a reduced dependence on location and orientation of a surface of the substrate relative to the multi-spectral sensor. The additive manufacturing process can involve use of a laser to generate a laser beam for fusion of the build material into the part. The system can be configured to set the multi-spectral sensor off-axis with respect to the laser (e.g., an optical path of the multi-spectral sensor is at an angle that is different than the angle of incidence of the laser beam). This can allow the multi-spectral sensor to collect spectral data simultaneously as the laser is used to build the part.
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公开(公告)号:US11927482B2
公开(公告)日:2024-03-12
申请号:US17604814
申请日:2020-03-27
Applicant: Applied Materials, Inc.
Inventor: Kin Pong Lo , Lara Hawrylchak , Malcolm J. Bevan , Theresa Kramer Guarini , Wei Liu , Bernard L. Hwang
CPC classification number: G01J3/10 , G01J3/0218 , G01J3/443 , G01J2003/2879
Abstract: One or more embodiments described herein generally relate to systems and methods for calibrating an optical emission spectrometer (OES) used for processing semiconductor substrates. In embodiments herein, a light fixture is mounted to a plate within a process chamber. A light source is positioned within the light fixture such that it provides an optical path that projects directly at a window through which the OES looks into the process chamber for its reading. When the light source is on, the OES measures the optical intensity of radiation from the light source. To calibrate the OES, the optical intensity of the light source is compared at two separate times when the light source is on. If the optical intensity of radiation at the first time is different than the optical intensity of radiation at the second time, the OES is modified.
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公开(公告)号:US11917744B2
公开(公告)日:2024-02-27
申请号:US17383060
申请日:2021-07-22
Applicant: PERKINELMER SCIENTIFIC CANADA ULC
Inventor: Tak Shun Cheung , Chui Ha Cindy Wong , William Fisher , Hamid Badiei
CPC classification number: H05H1/28 , H01J49/0468 , H01J49/105 , H05H1/4652 , G01J3/443
Abstract: A system for cooling an inductively coupled plasma (ICP) instrument includes: the ICP instrument; a pump in fluid communication with the instrument via a first conduit; and a micro-channel heat exchanger in fluid communication with the instrument via a second conduit, and in fluid communication with the pump via a third conduit. The pump is configured to generate a pump outlet pressure of coolant that exceeds a back pressure of the instrument such that a pressure of the coolant traveling through the second conduit and into the heat exchanger is less than or equal to 5 pounds per square inch (psi) above atmospheric pressure, as measured at an inlet to the heat exchanger.
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公开(公告)号:US20240062334A1
公开(公告)日:2024-02-22
申请号:US18493899
申请日:2023-10-25
Applicant: Purdue Research Foundation
Inventor: Peiyi Zhang , Fang Huang , Sheng Liu
CPC classification number: G06T3/4046 , G01J3/2823 , G01J3/443 , G01N21/6428 , G01N21/6458 , G06N3/08
Abstract: A fluorescent single molecule emitter simultaneously transmits its identity, location, and cellular context through its emission patterns. A deep neural network (DNN) performs multiplexed single-molecule analysis to enable retrieving such information with high accuracy. The DNN can extract three-dimensional molecule location, orientation, and wavefront distortion with precision approaching the theoretical limit of information content of the image which will allow multiplexed measurements through the emission patterns of a single molecule.
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