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1.发明授权公开(公告)号：US12174066B2
公开(公告)日：2024-12-24
申请号：US18486355
申请日：2023-10-13
Applicant: VIAVI SOLUTIONS INC.
Abstract: A system for a high resolution optical spectrum analyzer (OSA) using various optical configurations to reduce polarization dependent loss (PDL) is disclosed. The system may include a birefringent element to receive an input optical beam. The birefringent element may then split the optical beam into at least two exit beams. The system may also include an optical configuration comprising at least one optical element. The optical configuration may receive the at least two exit beams from the birefringent element and transform at least one of the two exit beams using the at least one optical element to provide two parallel beams with parallel polarizations. The optical configuration may then output the two parallel beams with parallel polarizations to a downstream optical element, such as a diffraction grating, or other optical element.
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公开(公告)号：US12169144B2
公开(公告)日：2024-12-17
申请号：US17636730
申请日：2020-08-20
Inventor： Rongguang Liang , Jian Liang
Abstract: Methods, apparatus and systems that relate to a low-cost reconfigurable polarimetric imaging are described. One example polarization imaging system includes a lens positioned to receive light reflected from one or more objects, and a spectral-polarization filter positioned at an aperture plane of the lens to filter the light received by the lens. The polarization imaging system can further include a sensor positioned to detect the filtered light from the spectral-polarization filter to form a polarization image of the one or more objects. The spectral-polarization filter comprises a first array of multiple spectral filters and a second array of multiple polarizers.
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3.发明公开公开(公告)号：US20240110831A1
公开(公告)日：2024-04-04
申请号：US18486355
申请日：2023-10-13
Applicant: VIAVI SOLUTIONS INC.
CPC classification number: G01J3/0224 , G01J3/447
Abstract: A system for a high resolution optical spectrum analyzer (OSA) using various optical configurations to reduce polarization dependent loss (PDL) is disclosed. The system may include a birefringent element to receive an input optical beam. The birefringent element may then split the optical beam into at least two exit beams. The system may also include an optical configuration comprising at least one optical element. The optical configuration may receive the at least two exit beams from the birefringent element and transform at least one of the two exit beams using the at least one optical element to provide two parallel beams with parallel polarizations. The optical configuration may then output the two parallel beams with parallel polarizations to a downstream optical element, such as a diffraction grating, or other optical element.
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公开(公告)号：US20240053202A1
公开(公告)日：2024-02-15
申请号：US18186102
申请日：2023-03-17
Applicant: COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES , STMicroelectronics (Crolles 2) SAS
Inventor： Jerome VAILLANT , Francois DENEUVILLE , Axel CROCHERIE , Alain OSTROVSKY
Abstract: The present description concerns a polarimetric image sensor formed inside and on top of a semiconductor substrate, the second comprising a plurality of pixels, each comprising: —a photosensitive region formed in the semiconductor substrate; —a diffraction structure formed on the side of an illumination surface of the photosensitive region; and —a polarization structure formed on the side of the diffraction structure opposite to the photosensitive region.
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5.发明授权公开(公告)号：US11828648B2
公开(公告)日：2023-11-28
申请号：US17334132
申请日：2021-05-28
Applicant: VIAVI SOLUTIONS INC.
CPC classification number: G01J3/0224 , G01J3/447
Abstract: A system for a high resolution optical spectrum analyzer (OSA) using various optical configurations to reduce polarization dependent loss (PDL) is disclosed. The system may include a birefringent element to receive an input optical beam. The birefringent element may then split the optical beam into at least two exit beams. The system may also include an optical configuration comprising at least one optical element. The optical configuration may receive the at least two exit beams from the birefringent element and transform at least one of the two exit beams using the at least one optical element to provide two parallel beams with parallel polarizations. The optical configuration may then output the two parallel beams with parallel polarizations to a downstream optical element, such as a diffraction grating, or other optical element.
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Patent Agency Ranking
公开(公告)号：US20230204422A1
公开(公告)日：2023-06-29
申请号：US17955881
申请日：2022-09-29
Applicant: Samsung Electronics Co., Ltd.
Inventor： Jinwoo Ahn , Juntaek Oh , Youngkyu Park , Eunsoo Hwang
CPC classification number: G01J3/447 , G01N21/9501 , G01N21/211 , G01J3/021 , G01J3/0208 , G01N2021/213
Abstract: An imaging assembly of a spectral imaging ellipsometer includes an analyzer configured to polarize reflected light reflected from a sample surface, an imaging mirror optical system disposed on an optical path of the reflected light passing through the analyzer and including a first mirror having a concave surface and a second mirror having a convex surface, and a light detector configured to receive light passing through the imaging mirror optical system to collect spectral data. The reflected light is firstly reflected by the first mirror, the firstly reflected light is secondarily reflected by the second mirror and travels toward the first mirror again, and then thirdly reflected by the first mirror to be imaged on a light receiving surface of the light detector.
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公开(公告)号：US11585749B2
公开(公告)日：2023-02-21
申请号：US17063483
申请日：2020-10-05
Applicant: Apple Inc.
Inventor： Miikka M. Kangas , Mark Alan Arbore , David I. Simon , Michael J. Bishop , James W. Hillendahl , Robert Chen
IPC: G01N21/27 , G01N21/35 , G01N21/47 , G01J3/32 , G01J3/36 , G01J3/433 , G01J3/447 , G01J3/02 , G01J3/42 , G01N21/49 , G01N21/21
Abstract: This relates to systems and methods for measuring a concentration and type of substance in a sample at a sampling interface. The systems can include a light source, optics, one or more modulators, a reference, a detector, and a controller. The systems and methods disclosed can be capable of accounting for drift originating from the light source, one or more optics, and the detector by sharing one or more components between different measurement light paths. Additionally, the systems can be capable of differentiating between different types of drift and eliminating erroneous measurements due to stray light with the placement of one or more modulators between the light source and the sample or reference. Furthermore, the systems can be capable of detecting the substance along various locations and depths within the sample by mapping a detector pixel and a microoptics to the location and depth in the sample.
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公开(公告)号：US11181469B2
公开(公告)日：2021-11-23
申请号：US16770219
申请日：2018-11-29
Applicant: Yokogawa Electric Corporation
Inventor： Kodai Murayama , Atsushi Ito , Fumie Watanabe
Abstract: A spectroscopic analysis device includes a light source configured to emit light including a plurality of wavelength components, a polarizer configured to convert the light emitted from the light source to a light of linearly polarized light to be radiated to a sample, a polarizing diffraction element configured to diffract and spectrally disperse a first polarization component included in the light having passed through the sample in a first direction, the polarizing diffraction element being configured to diffract and spectrally disperse a second polarization component included in the light in a second direction different from the first direction, a prism which is disposed on an exit side of the polarizing diffraction element and which has a first exit surface crossing the first direction and a second exit surface crossing the second direction, and in which angles of the first exit surface and the second exit surface with respect to a reference plane including the first direction and the second direction are different, an imaging element configured to capture an image of the first polarization component emitted from the first exit surface of the prism and an image of the second polarization component emitted from the second exit surface, and a processor configured to analyze the sample based on an imaging result of the imaging element.
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公开(公告)号：US20210173221A1
公开(公告)日：2021-06-10
申请号：US16762677
申请日：2018-11-08
Applicant: JENOPTIK Optical Systems GmbH
Inventor： Stephan FAHR , Torsten ERBE , Markus AUGUSTIN
Abstract: The invention relates to a device comprising a beam splitter and a method of using the device. The device comprises a beam emitting unit and a downstream beam splitter, which is formed by two adjacent planar plates of different materials. For a specified wavelength range of an optical beam from which a partial beam is to be coupled out by reflection, the material of the first planar plate has a minimum refractive index which is greater by a refractive index interval than the maximum refractive index of the material of the second planar plate. From the optical beam, which, collimated and linearly polarized parallel to a plane of incidence, impinges on the beam splitter at a certain angle of incidence, the partial beam having only a small summary percentage of the optical beam and a small spectral fluctuation range is coupled out.
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公开(公告)号：US20210018432A1
公开(公告)日：2021-01-21
申请号：US17063483
申请日：2020-10-05
Applicant: Apple Inc.
Inventor： Miikka M. Kangas , Mark Alan Arbore , David I. Simon , Michael J. Bishop , James W. Hillendahl , Robert Chen
IPC: G01N21/27 , G01N21/35 , G01N21/47 , G01J3/32 , G01J3/36 , G01J3/433 , G01J3/447 , G01J3/02 , G01J3/42
Abstract: This relates to systems and methods for measuring a concentration and type of substance in a sample at a sampling interface. The systems can include a light source, optics, one or more modulators, a reference, a detector, and a controller. The systems and methods disclosed can be capable of accounting for drift originating from the light source, one or more optics, and the detector by sharing one or more components between different measurement light paths. Additionally, the systems can be capable of differentiating between different types of drift and eliminating erroneous measurements due to stray light with the placement of one or more modulators between the light source and the sample or reference. Furthermore, the systems can be capable of detecting the substance along various locations and depths within the sample by mapping a detector pixel and a microoptics to the location and depth in the sample.
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