公开(公告)号：US12287241B2

公开(公告)日：2025-04-29

申请号：US17915388

申请日：2020-12-16

Applicant: Beijing RSLaser Opto-Electronics Technology Co., Ltd.

Inventor： Guangyi Liu ,  Rui Jiang ,  Xiaoquan Han ,  Jiangshan Zhao ,  Pengfei Sha ,  Qingqing Yin ,  Hua Zhang ,  Xinyue Hu

IPC: G01J3/45 ,  G01J3/02

Abstract: Provided are a device (4) and a method for online measuring a spectrum for a laser device. The device (4) for online measuring a spectrum for a laser device includes: a first optical path assembly (G1) and a second optical path assembly (G2), and the second optical path assembly (G2) and the first optical path assembly (G1) constitute a measurement optical path. The second optical path assembly (G2) includes: an FP etalon (15) and a grating (18). The homogenized laser beam passes through the FP etalon (15) to generate an interference fringe. The grating (18) is arranged after the FP etalon (15), or is arranged before the FP etalon (15) in the measurement optical path, and is configured to disperse the laser beam passing through the FP etalon (15).

公开(公告)号：US12281940B2

公开(公告)日：2025-04-22

申请号：US17693404

申请日：2022-03-13

Applicant: LITE-ON SINGAPORE PTE. LTD.

Inventor： Rui-Tao Zheng

IPC: G01J3/12 ,  G01J3/02 ,  G01J3/10 ,  G01J3/36 ,  G01J3/45 ,  G02B5/28

Abstract: A filter and a miniature spectrum measuring device are provided. The filter includes a plurality of film structures. Each of the film structures includes an H-type structural film, an L-type structural film, and a cavity film disposed between the H-type structural film and the L-type structural film.

公开(公告)号：US12241781B2

公开(公告)日：2025-03-04

申请号：US17672114

申请日：2022-02-15

Applicant: THE UNIVERSITY OF TOKYO

Inventor： Daisuke Hirano ,  Makoto Gonokami ,  Kosuke Yoshioka

IPC: G01J3/18 ,  G01J3/02 ,  G01J3/10 ,  G01J3/28 ,  G01J3/45

Abstract: A coherent light source outputs coherent light including high-order harmonics obtained by irradiating short-pulse laser light to a nonlinear medium. A spectrometer includes a grating that diffracts the coherent light and an image sensor that measures an image of the diffracted light. In a first state, a first double slit having a pair of apertures spaced apart in a first direction is arranged at a predetermined position between coherent light source and an incident slit of spectrometer. In a second state, a second double slit that is a replica of first double slit is arranged at the predetermined position as a replacement of first double slit with a sample held in one aperture. A calculation processing device calculates optical constants of the sample based on interference images measured in the first and second states.

公开(公告)号：US20250027813A1

公开(公告)日：2025-01-23

申请号：US18908626

申请日：2024-10-07

Applicant: Apple Inc.

Inventor： Mark Alan Arbore ,  Thomas C. Greening ,  Yongming Tu

IPC: G01J3/02 ,  G01J3/10 ,  G01J3/18 ,  G01J3/32 ,  G01J3/45 ,  G02B6/293 ,  G02B6/42 ,  G02B27/10 ,  G02F1/21

Abstract: Configurations for light source modules and methods for mitigating coherent noise are disclosed. The light source modules may include multiple light source sets, each of which may include multiple light sources. The light emitted by the light sources may be different wavelengths or the same wavelength depending on whether the light source module is providing redundancy of light sources, increased power, coherent noise mitigation, and/or detector mitigation. In some examples, the light source may emit light to a coupler or a multiplexer, which may then be transmitted to one or more multiplexers. In some examples, the light source modules provide one light output and in other examples, the light source modules provide two light outputs. The light source modules may provide light with approximately zero loss and the wavelengths of light may be close enough to spectroscopically equivalent respect to a sample and far enough apart to provide coherent noise mitigation.

公开(公告)号：US20240369409A1

公开(公告)日：2024-11-07

申请号：US18777447

申请日：2024-07-18

Applicant: II-VI Delaware, Inc.

Inventor： Michael John Laurence CAHILL ,  Yang LI

IPC: G01J3/02 ,  G01J3/45 ,  H04B10/25

Abstract: Described herein is a wavelength reference device comprising a housing defining an internal environment having a known temperature. A broadband optical source is disposed within the housing and configured to emit an optical signal along an optical path. The optical signal has optical power within a wavelength band of interest. An optical etalon is also disposed within the housing and positioned in the optical path to filter the optical signal to define a filtered optical signal that includes one or more reference spectral features having a known wavelength at the known temperature. The device also includes an optical output for outputting the filtered optical signal.

公开(公告)号：US12031863B2

公开(公告)日：2024-07-09

申请号：US16625688

申请日：2018-07-06

Applicant: HAMAMATSU PHOTONICS K.K.

Inventor： Tatsuya Sugimoto ,  Tomofumi Suzuki ,  Kyosuke Kotani

IPC: G01J3/02 ,  G01B9/02 ,  G02B26/12 ,  G01J3/45

CPC classification number: G01J3/021 ,  G01B9/02 ,  G02B26/12 ,  G01J3/45

Abstract: An optical device includes: a base which includes a main surface; a movable mirror which includes a mirror surface; a first and a second elastic support portions which support the movable mirror so as to be movable along a first direction perpendicular to the main surface; an actuator which moves the movable mirror; and a first optical function portion which is disposed at one side of the movable mirror in a second direction perpendicular to the first direction. The first elastic support portion includes a pair of first levers extending from the movable mirror toward both sides of the first optical function portion in a third direction perpendicular to the first and the second directions. A length of each of first levers in the second direction is larger than the shortest distance between an outer edge of the mirror surface and an edge of the first optical function portion.

公开(公告)号：US12029547B2

公开(公告)日：2024-07-09

申请号：US17238052

申请日：2021-04-22

Applicant: Hyperspectral Corp.

Inventor： David M. Palacios ,  Harry Hopper

IPC: A61B5/08 ,  A61B5/00 ,  A61B5/097 ,  A61B10/00 ,  G01J3/18 ,  G01J3/45 ,  G01N1/42 ,  G01N21/25 ,  G01N21/3504 ,  G01N21/359 ,  G01N33/497

CPC classification number: A61B5/082 ,  A61B5/7282 ,  A61B10/00 ,  G01J3/18 ,  G01J3/45 ,  G01N1/42 ,  G01N21/255 ,  G01N21/3504 ,  G01N21/359 ,  G01N33/497 ,  A61B5/097 ,  A61B2010/0087 ,  G01N2033/4975 ,  G01N2201/063

Abstract: A method comprising at least one light source configured to generate a light of at least one wavelength and project the light over an optical path, a sample device, the device containing a sample obtained from exhalation of a person, a vortex mask configured to receive the light after the light passes through at least a portion of the sample device, the vortex mask including a series of concentric circles etched in a substrate, the vortex mask configured to provide destructive interference of coherent light received from the at least one light source, a detector configured to detect and measure wavelength intensities from the light in the optical path, the wavelength intensities being impacted by the light passing through the sample, the detector receiving the light that remained after passing through the vortex mask, and a processor configured to provide measurement results based on the wavelength intensities.

公开(公告)号：US12029481B2

公开(公告)日：2024-07-09

申请号：US16854515

申请日：2020-04-21

Applicant: Digital Diagnostics Inc.

Inventor： Michael D. Abramoff ,  Edward DeHoog

IPC: A61B3/10 ,  A61B3/00 ,  A61B3/12 ,  A61B3/14 ,  G01B9/02 ,  G01B9/02015 ,  G01B9/02091 ,  G01J3/45

CPC classification number: A61B3/102 ,  A61B3/0008 ,  A61B3/0025 ,  A61B3/1005 ,  A61B3/1225 ,  A61B3/14 ,  G01B9/02027 ,  G01B9/02028 ,  G01B9/02044 ,  G01B9/02091 ,  G01J3/45 ,  G01B2290/65

Abstract: Provided is a snapshot spectral domain optical coherence tomographer comprising a light source providing a plurality of beamlets; a beam splitter, splitting the plurality of beamlets into a reference arm and a sample arm; a first optical system that projects the sample arm onto multiple locations of a sample; a second optical system for collection of a plurality of reflected sample beamlets; a third optical system projecting the reference arm to a reflecting surface and receiving a plurality of reflected reference beamlets; a parallel interferometer that provides a plurality of interferograms from each of the plurality of sample beamlets with each of the plurality of reference beamlets; an optical image mapper configured to spatially separate the plurality of interferograms; a spectrometer configured to disperse each of the interferograms into its respective spectral components and project each interferogram in parallel; and a photodetector providing photon quantification.

公开(公告)号：US20240201014A1

公开(公告)日：2024-06-20

申请号：US18066899

申请日：2022-12-15

Applicant: Lawrence Livermore National Security, LLC

Inventor： David J. Erskine

IPC: G01J3/45

CPC classification number: G01J3/45 ,  G01J2003/283 ,  G01J2003/451

Abstract: Methods, systems and devices are described that improve optical spectroscopic techniques and particularly those that involve externally dispersed interferometer (EDI) techniques that result in an output spectrum having improved stability characteristics. The output spectrum minimizes the unwanted shifts in wavelength when the spectrograph component of the EDI instrument is under stresses that would otherwise shift or distort the wavelength positions of the spectrum.

公开(公告)号：US11999612B2

公开(公告)日：2024-06-04

申请号：US17525950

申请日：2021-11-14

Applicant: Naiqian Han

Inventor： Naiqian Han

IPC: B81B3/00 ,  G01J3/02 ,  G01J3/10 ,  G01J3/45 ,  G02B27/30

CPC classification number: B81B3/0021 ,  B81B3/0024 ,  G01J3/021 ,  G01J3/0218 ,  G01J3/10 ,  G01J3/45 ,  B81B2201/0264 ,  B81B2201/0271 ,  B81B2201/0278 ,  B81B2201/047 ,  G02B27/30

Abstract: Provided is an optical micro-electro-mechanical system (MEMS) based monitoring system, comprising: a broadband light source, a tunable optical filter (TOF), an optical etalon, a plurality of optical receivers, a plurality of optical couplers, and a plurality of optical MEM sensors; the TOF is configured to capture a transmission, reflection or interference spectrum of the optical MEMS sensors; wherein the peak or depression wavelength in the transmission, reflection or interference spectrum corresponds to a parameter of the pressure, temperature or stress, and the peak or depression wavelength can be obtained by comparing the spectrum with the periodic spectrum of the optical etalon, the optical etalon has an absolute wavelength mark; and the optical MEMS sensor comprises an optical MEMS resonator. The parameter of the pressure, temperature or stress can be obtained by the peak or depression wavelength in the transmission, the reflection or the interference spectrum of the optical MEMS sensor.