Infrared light source device and fourier transform infrared spectroscope

    公开(公告)号:US12216006B2

    公开(公告)日:2025-02-04

    申请号:US17729220

    申请日:2022-04-26

    Abstract: An infrared light source device includes: a heater portion which emits infrared light by being heated; and a cover member arranged to cover an entire circumference of the heater portion without contacting the heater portion, and having a hole formed therein for emitting the infrared light from the heater portion to outside. A material for the cover member is a pure aluminum (an aluminum alloy with a purity of 99% or more), which has a high heat reflectivity and is less likely to be denatured by heat dissipation from the heater portion.

    LENS UNIT, OPTICAL SYSTEM, AND SPECTRAL CHARACTERISTIC MEASURING DEVICE

    公开(公告)号:US20240411116A1

    公开(公告)日:2024-12-12

    申请号:US18291822

    申请日:2022-08-01

    Inventor: Mitsuru TOMITA

    Abstract: Provided is a lens unit that has good resolution while sufficiently suppressing chromatic aberration, an optical system that includes the lens unit, and a spectral characteristic measurement device that includes the lens unit. A lens unit (1) includes a first lens (L1), a second lens (L2), and a third lens (L3) that are disposed in order, and is used for an infrared region that includes at least any one of wavelengths in a range of 7 μm to 14 μm. The effective diameter of the first lens (L1) is larger than the effective diameter of the third lens (L3), and the optical axis thickness of the third lens (L3) is greater than the optical axis thickness of any one of the first lens (L1) and the second lens (L2).

    ON-CHIP FOURIER TRANSFORM SPECTROMETER BASED ON DOUBLE-LAYER HELICAL WAVEGUIDE

    公开(公告)号:US20240337536A1

    公开(公告)日:2024-10-10

    申请号:US18413015

    申请日:2024-01-15

    CPC classification number: G01J3/45 G02F1/212 G02F1/2252 G01J2003/4538

    Abstract: An on-chip Fourier transform spectrometer based on a double-layer spiral waveguide comprises, in order, a waveguide input coupler, a 1×N optical splitter, N double-layer waveguide Y-branch structures, N double-layer spiral waveguides with incremental lengths, N double-layer waveguide Y-branch structures arranged in opposite directions, and N germanium-silicon detectors. The group index difference between the odd mode and the even mode in the double-layer waveguide makes the double-layer spiral waveguide function like an asymmetric Mach-Zehnder interferometer. N double-layer spiral waveguides with incremental lengths are used to achieve a spatial heterodyne based Fourier transform spectrometer. Spectral reconstruction from the measured interference fringes can be achieved by a regression algorithm. The invention meets the application need for miniaturization and portability of Fourier transform spectrometers, and has lower temperature sensitivity compared with the existing on-chip spectrometers on the silicon platform.

    ENHANCED FULL RANGE OPTICAL COHERENCE TOMOGRAPHY

    公开(公告)号:US20240142307A1

    公开(公告)日:2024-05-02

    申请号:US18542051

    申请日:2023-12-15

    Inventor: Xiang WEI Tony KO

    CPC classification number: G01J3/453 G01J3/2823 G01J2003/4538

    Abstract: A full-range imaging method doubles imaging range of conventional techniques by removing mirror images of an imaged object that limit conventional images to a “half-range” and that are caused in part by the loss of phase information in a detected signal. Phase information of the detected signal is reconstructed with an averaging technique based on a modulated phase induced in the detected signal during scanning.

    Fourier spectrophotometer with polarization multiplexing optical system

    公开(公告)号:US11927483B2

    公开(公告)日:2024-03-12

    申请号:US17771517

    申请日:2020-10-27

    Abstract: A Fourier spectrophotometer includes: a light source; an interferometer configured to obtain first and second interferograms whose intensity distributions are inverted from each other from the light emitted from light source; a multiplexing optical system configured to multiplex the first and second interferograms to irradiate the sample with a resultant interferogram; a demultiplexing optical system configured to demultiplex the first and second interferograms contained in the light passing through the sample; a light receiver configured to output a first light reception signal obtained by receiving the demultiplexed first interferogram and a second light reception signal obtained by receiving the demultiplexed second interferogram; and a signal processing device configured to perform processing for obtaining a noise-removed spectrum of the wavelength component in the analysis wavelength band by using the first and second light reception signals.

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