STATE-OF-POLARIZATION MONITORING APPARATUS, STATE-OF-POLARIZATION MONITORING METHOD, AND NON-TRANSITORY COMPUTER-READABLE STORAGE MEDIUM

    公开(公告)号:US20250132840A1

    公开(公告)日:2025-04-24

    申请号:US18898923

    申请日:2024-09-27

    Inventor: Mingqi WU

    Abstract: A state-of-polarization monitoring apparatus performs: determining a first state-of-polarization (SOP) vector that represents an SOP of an optical reception signal in a the first partial period for each first partial period and a second SOP vector that represents an SOP of the optical reception signal in the second partial period for each second partial period; computing a rotation angle of the first SOP vector for each pair of first SOP vectors and a rotation angle of the second SOP vector for each pair of second SOP vectors; determining whether a length of the first partial period or a length of an interval between the first partial periods is appropriate based on the rotation angles of the first and second SOP vectors.

    Cooperative polarization skylight background radiation measurement device and method

    公开(公告)号:US12135277B1

    公开(公告)日:2024-11-05

    申请号:US18656937

    申请日:2024-05-07

    Abstract: Provided are a cooperative polarization skylight background radiation measurement device and method, belonging to the field of polarized radiation remote sensing. The device includes a measurement probe, a lower computer control system, a two-dimensional turntable, a base and data transmission interface, as well as an upper computer. The method includes the following steps: the cooperative skylight background radiation polarization measurement device is initialized, a polarization wheel is returned to a zero position, and dark noise is collected by a double-path spectrometer; then a measurement mode is selected for measurement; and finally, spectral polarization data of each wave band acquired by the double-path spectrometer and a division-of-focal plane polarization camera is transmitted to the upper computer through a data line, original spectral light intensity data is calculated according to a measurement principle, and finally a degree of polarization and an azimuth angle of polarization are obtained.

    STRESS ENGINEERING OF TRANSPARENT MATERIALS

    公开(公告)号:US20220373411A1

    公开(公告)日:2022-11-24

    申请号:US17324038

    申请日:2021-05-18

    Abstract: A method and system for stress engineering of a transparent material can include an imaging system that can visualize a spatial distribution of an internal stress in a transparent material, an actuator system that can induce stress in the transparent material, the actuator system comprising one or more actuator elements, and a feedback system that can communicate with the imaging system and the actuator system, and which can guide an internal stress distribution in the transparent material toward a preferred final state.

    Variable aperture mask
    9.
    发明授权

    公开(公告)号:US11268901B2

    公开(公告)日:2022-03-08

    申请号:US15930379

    申请日:2020-05-12

    Abstract: A collection system of a semiconductor metrology tool includes a chuck to support a target from which an optical beam is reflected and a spectrometer to receive the reflected optical beam. The collection system also includes a plurality of aperture masks arranged in a rotatable sequence about an axis parallel to an optical axis. Each aperture mask of the plurality of aperture masks is rotatable into and out of the reflected optical beam between the chuck and the spectrometer to selectively mask the reflected optical beam.

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