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公开(公告)号:US20250132840A1
公开(公告)日:2025-04-24
申请号:US18898923
申请日:2024-09-27
Applicant: NEC Corporation
Inventor: Mingqi WU
IPC: H04B10/61 , G01J4/00 , H04B10/079
Abstract: A state-of-polarization monitoring apparatus performs: determining a first state-of-polarization (SOP) vector that represents an SOP of an optical reception signal in a the first partial period for each first partial period and a second SOP vector that represents an SOP of the optical reception signal in the second partial period for each second partial period; computing a rotation angle of the first SOP vector for each pair of first SOP vectors and a rotation angle of the second SOP vector for each pair of second SOP vectors; determining whether a length of the first partial period or a length of an interval between the first partial periods is appropriate based on the rotation angles of the first and second SOP vectors.
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公开(公告)号:US12135277B1
公开(公告)日:2024-11-05
申请号:US18656937
申请日:2024-05-07
Applicant: Hefei Institutes of Physical Science, CAS
Inventor: Congming Dai , Wenqing Xu , Jie Zhan , Shuai Li , Gang Xu , Rui Wang
Abstract: Provided are a cooperative polarization skylight background radiation measurement device and method, belonging to the field of polarized radiation remote sensing. The device includes a measurement probe, a lower computer control system, a two-dimensional turntable, a base and data transmission interface, as well as an upper computer. The method includes the following steps: the cooperative skylight background radiation polarization measurement device is initialized, a polarization wheel is returned to a zero position, and dark noise is collected by a double-path spectrometer; then a measurement mode is selected for measurement; and finally, spectral polarization data of each wave band acquired by the double-path spectrometer and a division-of-focal plane polarization camera is transmitted to the upper computer through a data line, original spectral light intensity data is calculated according to a measurement principle, and finally a degree of polarization and an azimuth angle of polarization are obtained.
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公开(公告)号:US12135240B2
公开(公告)日:2024-11-05
申请号:US17778842
申请日:2020-12-06
Applicant: Purdue Research Foundation
Inventor: Zubin Jacob , Fanglin Bao , Xueji Wang
IPC: G01J3/28 , G01J3/00 , G01J3/10 , G01J3/447 , G01J4/00 , G01J4/04 , G01J5/00 , G01J5/48 , G01J5/59 , G01N21/21 , G01N21/25 , G01N21/35 , G06F18/22 , G06V10/143 , G06V10/30 , G06V10/40 , G06V10/54 , G06V10/75
Abstract: Summary: The invention relates to a temperature sensor, full-A magnetic element (3) that has at least one magnetic Layer (1), its magnetic properties depend on the temperature characterized in that—The magnetic layer (1) has a vortex-shaped magnetization distribution with a magnetic vortex core (2) has, wherein the vortex-shaped magnetization distribution is formed in a layer plane and the vortex core (2) is formed perpendicular to the layer plane,—An excitation unit (15) which is used to excite the vortex-shaped Magnetization distribution to a gyrotropic magnetization motion is provided,—A detection unit (16) for detecting a resonance frequency the gyrotropic magnetization movement is provided and—An evaluation unit (19) for determining a temperature from the resonance frequency of the gyrotropic magnetization movement is provided.
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公开(公告)号:US11965793B2
公开(公告)日:2024-04-23
申请号:US17324038
申请日:2021-05-18
Applicant: Palo Alto Research Center Incorporated
Inventor: Jacob Chamoun , Mahati Chintapalli , David K. Biegelsen
CPC classification number: G01L5/0076 , G01J4/00 , G01L1/24
Abstract: A method and system for stress engineering of a transparent material can include an imaging system that can visualize a spatial distribution of an internal stress in a transparent material, an actuator system that can induce stress in the transparent material, the actuator system comprising one or more actuator elements, and a feedback system that can communicate with the imaging system and the actuator system, and which can guide an internal stress distribution in the transparent material toward a preferred final state.
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公开(公告)号:US11892529B2
公开(公告)日:2024-02-06
申请号:US17565806
申请日:2021-12-30
Applicant: Sufei Shi , Tianmeng Wang
Inventor: Sufei Shi , Tianmeng Wang
IPC: G01R33/20 , G01J4/00 , H01L29/24 , H01L29/786
CPC classification number: G01R33/20 , G01J4/00 , H01L29/24 , H01L29/78696
Abstract: A transition metal dichalcogenides device includes a substrate, a bottom layer of boron nitride, a tungsten diselenide monolayer on the bottom layer of boron nitride, a top layer of boron nitride on the tungsten diselenide monolayer such that the bottom and top layers of boron nitride at least partially encapsulate the tungsten diselenide monolayer, a source electrode on the substrate, a drain electrode on the substrate, and a top gate electrode on the top layer of boron nitride. The tungsten diselenide monolayer is configured to reveal excitons when at least one of a K valley and a K′ valley of the tungsten diselenide monolayer is exposed to excitation photon energy and an external magnetic field. The excitons are giant valley-polarized Rydberg excitons in excited states ranging from 2s to 11s when the external magnetic field is in the range of about −17 T to about 17 T.
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公开(公告)号:US11796441B2
公开(公告)日:2023-10-24
申请号:US17128392
申请日:2020-12-21
Applicant: NGK INSULATORS, LTD.
Inventor: Ryota Kurahashi , Yoshihiro Sato , Takafumi Terahai
CPC classification number: G01N15/08 , G01N15/0806 , G01N2015/084 , G01N2015/0846
Abstract: A method for inspecting a pillar-shaped honeycomb structure including the steps of: imaging a pattern of transmitted light from the second end face according to arrangement of the plugged portions of first cells and second cells, with a camera via a light diffusing film placed parallel to a second end face of the pillar-shaped honeycomb structure in a non-contact state with the second end face, which pattern is obtained by irradiating a first end face with light; and detecting a defective plugged portion(s) of the second cells based on an image of the pattern of transmitted light imaged with the camera.
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公开(公告)号:US20220373411A1
公开(公告)日:2022-11-24
申请号:US17324038
申请日:2021-05-18
Applicant: Palo Alto Research Center Incorporated
Inventor: Jacob Chamoun , Mahati Chintapalli , David K. Biegelsen
Abstract: A method and system for stress engineering of a transparent material can include an imaging system that can visualize a spatial distribution of an internal stress in a transparent material, an actuator system that can induce stress in the transparent material, the actuator system comprising one or more actuator elements, and a feedback system that can communicate with the imaging system and the actuator system, and which can guide an internal stress distribution in the transparent material toward a preferred final state.
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公开(公告)号:US11474365B2
公开(公告)日:2022-10-18
申请号:US16582113
申请日:2019-09-25
Inventor: Michael J. Choiniere , Jay W. Coffey , Jason R. Lane , Davis A. Lange , Jason T. Stockwell
Abstract: The system and method for imaging having filter containing polarized elements, multispectral elements or both being oscillated in circular or linear motion so each individual pixel will view a scene thru the individual filters. The motion of the filter is synchronized with a frame rate of an imager. In one example this is accomplished by micro actuators. Each pixel sampling feeds a processor detection algorithm that determines if a multispectral/polarization signature is present in the scene.
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公开(公告)号:US11268901B2
公开(公告)日:2022-03-08
申请号:US15930379
申请日:2020-05-12
Applicant: KLA Corporation
Inventor: Barry Blasenheim , Noam Sapiens , Michael Friedmann , Pablo Rovira
Abstract: A collection system of a semiconductor metrology tool includes a chuck to support a target from which an optical beam is reflected and a spectrometer to receive the reflected optical beam. The collection system also includes a plurality of aperture masks arranged in a rotatable sequence about an axis parallel to an optical axis. Each aperture mask of the plurality of aperture masks is rotatable into and out of the reflected optical beam between the chuck and the spectrometer to selectively mask the reflected optical beam.
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公开(公告)号:US11268900B2
公开(公告)日:2022-03-08
申请号:US16781474
申请日:2020-02-04
Applicant: NIKON CORPORATION
Inventor: Takanori Kojima , Satoru Odate , Toru Takagi
IPC: G01N21/21 , G01N21/31 , G01N21/25 , G01J3/51 , G01J3/28 , G01J3/02 , G01J4/04 , G01J4/00 , G01J3/00 , H01L27/146 , G06T15/00 , A61B1/06 , A61B1/00 , A61B1/04 , G06T7/521 , G01N21/47 , G01J1/42
Abstract: A polarization property image measurement device includes: a first radiation unit that radiates light beams in different polarization conditions onto a target object after subjecting the light beams to intensity modulation at frequencies different from one another; a light receiving unit including first photoelectric conversion units that photoelectrically convert the light beams having been radiated from the first radiation unit and scattered at the target object in correspondence to each of the different polarization conditions, and second photoelectric conversion units that photoelectrically convert visible light from the target object; and a processor that detects signals individually output from the first photoelectric conversion units at the different frequencies and differentiates each signal from other signals so as to determine an origin of the signal as one of the light beams; and creates an image of the target object based upon signals individually output from the second photoelectric conversion units.
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