公开(公告)号：US12217507B2

公开(公告)日：2025-02-04

申请号：US17911004

申请日：2020-12-28

Applicant: ZHEJIANG UNIVIEW TECHNOLOGIES CO., LTD.

Inventor： Guozhen Wang ,  Ping Xu

IPC: G06V20/50 ,  G01J4/04 ,  G02B27/28 ,  G06T7/70 ,  G06V10/36

Abstract: Provided are a vehicle monitoring method and a vehicle monitoring system. The vehicle monitoring method includes that: a polarization angle of polarized light in a sky image reflected by a vehicle window in a monitoring scenario is calculated, and a light-filtering polarization angle is calculated according to the polarization angle of the polarized light in the sky image reflected by the vehicle window, where the polarized light in the sky image is formed by scattered sunlight in a sky region corresponding to the sky image; the polarized light in the sky image reflected by the vehicle window in the monitoring scenario is filtered out according to the light-filtering polarization angle; and the monitoring scenario is imaged to form a monitoring image.

公开(公告)号：US12135240B2

公开(公告)日：2024-11-05

申请号：US17778842

申请日：2020-12-06

Applicant: Purdue Research Foundation

Inventor： Zubin Jacob ,  Fanglin Bao ,  Xueji Wang

IPC: G01J3/28 ,  G01J3/00 ,  G01J3/10 ,  G01J3/447 ,  G01J4/00 ,  G01J4/04 ,  G01J5/00 ,  G01J5/48 ,  G01J5/59 ,  G01N21/21 ,  G01N21/25 ,  G01N21/35 ,  G06F18/22 ,  G06V10/143 ,  G06V10/30 ,  G06V10/40 ,  G06V10/54 ,  G06V10/75

Abstract: Summary: The invention relates to a temperature sensor, full-A magnetic element (3) that has at least one magnetic Layer (1), its magnetic properties depend on the temperature characterized in that—The magnetic layer (1) has a vortex-shaped magnetization distribution with a magnetic vortex core (2) has, wherein the vortex-shaped magnetization distribution is formed in a layer plane and the vortex core (2) is formed perpendicular to the layer plane,—An excitation unit (15) which is used to excite the vortex-shaped Magnetization distribution to a gyrotropic magnetization motion is provided,—A detection unit (16) for detecting a resonance frequency the gyrotropic magnetization movement is provided and—An evaluation unit (19) for determining a temperature from the resonance frequency of the gyrotropic magnetization movement is provided.

公开(公告)号：US12123951B1

公开(公告)日：2024-10-22

申请号：US17733227

申请日：2022-04-29

Applicant: BAE SYSTEMS INFORMATION AND ELECTRONIC SYSTEMS INTEGRATION INC.

Inventor： Michael J. DeWeert ,  Eric M. Louchard ,  Reid A. Noguchi ,  Gary Sawai ,  Dugan C. Yoon

IPC: G01S17/89 ,  G01J4/04 ,  G01S7/4861 ,  G06T5/73

CPC classification number: G01S17/89 ,  G01J4/04 ,  G01S7/4861 ,  G06T5/73 ,  G06T2207/20201

Abstract: A system and method is provided to characterize optical properties (Scattering, attenuation, de-polarization) of a light-transmitting medium and local environment, by determining a scattering rate of light through a medium, wherein determining the scattering rate of light through the medium is accomplished by utilizing polarized light transmitted from an optical source. The system and method performs a function based on the characterized optical properties of the medium, wherein the function is one of, for example: detection of objects embedded in the medium, object ranging through the medium, or deblurring of images acquired through the medium.

公开(公告)号：US12117344B2

公开(公告)日：2024-10-15

申请号：US17743937

申请日：2022-05-13

Applicant: ARIZONA BOARD OF REGENTS ON BEHALF OF ARIZONA STATE UNIVERSITY

Inventor： Yu Yao ,  Chao Wang ,  Chu Wang ,  Jing Bai ,  Ali Basiri ,  Xiahui Chen

IPC: G01J4/04 ,  G02B5/30

CPC classification number: G01J4/04 ,  G02B5/3025

Abstract: A method of fabricating a polarization sensor is described. It includes a quarter-wave plate to convert circularly polarized light into linearly polarized light. The quarter-wave plate is realized as a metasurface. The sensor also includes a linear polarizer to analyze the light generated by the quarter wave plate, and a photodetector to receive the analyzed light. The sensor may be combined with other linear polarization sensors to form a sensor capable of complete measurement of the polarization state of incident light.

公开(公告)号：US12105018B2

公开(公告)日：2024-10-01

申请号：US17632035

申请日：2020-07-30

Applicant: Shin-Etsu Chemical Co., Ltd.

Inventor： Takashi Uchida

IPC: G01N21/21 ,  C08G65/336 ,  G01B21/08 ,  G01J4/04 ,  G01N21/41 ,  G01Q60/24

CPC classification number: G01N21/211 ,  C08G65/336 ,  G01B21/08 ,  G01J4/04 ,  G01N21/41 ,  G01Q60/24

Abstract: Provided is a method capable of precisely, reproducibly and directly measuring, by an ellipsometry method, optical constants (refractive index n, extinction coefficient κ) of a fluorine-containing organosilicon compound thin film having a homogeneous surface with a small surface roughness and haze value. The method for measuring the optical constants of the thin film of the fluorine-containing organosilicon compound, includes:



a step of forming the thin film of the fluorine-containing organosilicon compound on a base material, the thin film having, as surface roughnesses, an arithmetic mean roughness of smaller than 1.0 nm and a root mean square roughness of smaller than 2.0 nm, a haze value of smaller than 0.3 and a film thickness of 3 to 10 nm; and
a step of measuring the optical constants of the thin film formed on the base material by the ellipsometry method.

公开(公告)号：US20240288309A1

公开(公告)日：2024-08-29

申请号：US18573375

申请日：2021-06-23

Applicant: Purdue Research Foundation

Inventor： Xueji Wang ,  Zubin Jacob

IPC: G01J4/04 ,  G01J3/02 ,  G01J3/28 ,  G01J3/447

CPC classification number: G01J4/04 ,  G01J3/0229 ,  G01J3/0237 ,  G01J3/2823 ,  G01J3/447 ,  G01J2003/2826

Abstract: A tunable hyperspectral-polarimetric filter system includes a first polarizer, a crystal filter and a second polarizer. The first polarizer is configured to transmit light in a first direction of linear polarization. The polarization selection may be substantially the same for all wavelengths at a spectral range of interest. The crystal filter, may be parallelly and coaxially disposed after the first polarizer. The crystal filter is configured to rotates the first direction of linear polarization for light transmitted by the first polarizer, wherein rotation angles differ for different wavelengths at the spectral range of interest. The second polarizer may be parallelly and coaxially disposed after the crystal filter. The second polarizer may substantially transmit a second direction of linear polarization of the light transmitted by the crystal filter. The first polarizer and/or the second polarizer are rotatable to tune for different transmission spectra for spectral and polarimetric imaging resolution.

公开(公告)号：US20240142758A1

公开(公告)日：2024-05-02

申请号：US18407012

申请日：2024-01-08

Applicant: ADVANCED OPTICAL TECHNOLOGIES, INC.

Inventor： Brian G. Hoover ,  Jonathan H. Turner

IPC: G02B21/00 ,  G01J4/04 ,  G01N21/21

CPC classification number: G02B21/0092 ,  G01J4/04 ,  G01N21/21 ,  G01N2021/8477 ,  G02B21/0068

Abstract: A polarimeter and a method of analyzing and imaging microstructural material orientation of a polished reflective sample are disclosed. The polarimeter, which is a partial Mueller-matrix polarimeter (pMMP), accesses multiple independent polarization channels by employing two independent polarization modulators configured to switch serially among multiple independent settings, wherein the combination of the settings of the first and second polarization modulators defines an independent polarization channel, and wherein an imaging detector produces a set of polarization images that are synchronized with the channels formed by the polarization modulators; and wherein a processor connected with a memory executes a classification algorithm stored in the memory that maps the set of polarization images to one or more material orientation images by mapping the set of values for each detector pixel corresponding to the set of polarization images to a value of material orientation at each pixel coordinate using a model. The invention can thereby create material microstructural orientation images of diverse anisotropic materials, for instance polymer domains, fiber bundles or plys, and crystalline grains.

公开(公告)号：US20240125993A1

公开(公告)日：2024-04-18

申请号：US18274360

申请日：2022-01-26

Applicant: ROLIC TECHNOLOGIES AG

Inventor： David PIRES ,  Richard FRANTZ

IPC: G02B5/30 ,  G01J1/04 ,  G01J4/04

CPC classification number: G02B5/3016 ,  G01J1/0429 ,  G01J4/04

Abstract: SUMMARY
The present invention relates to a method for manufacturing a spatially limited film stack comprising an optically anisotropic film on an optical sensor device with a light sensor element, such that the film stack covers the light sensor element but not the entire surface area of the optical sensor device. An electronic device manufactured according to the method of the invention can be used for analyzing the polarization state of light.

公开(公告)号：US11946809B2

公开(公告)日：2024-04-02

申请号：US17740529

申请日：2022-05-10

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Ingi Kim ,  Minhwan Seo ,  Sangwoo Bae ,  Akinori Okubo ,  Jungchul Lee ,  Eunhee Jeang

IPC: G01J4/02 ,  G01J4/04

CPC classification number: G01J4/02 ,  G01J4/04

Abstract: Provided is a polarization measuring device including a stage on which a measurement target is provided, a light source assembly configured to emit incident light, a first polarimeter configured to polarize the incident light, a second polarimeter configured to polarize reflected light reflected from the measurement target that is irradiated by the incident light, a filter assembly configured to remove noise from the reflected light, and a detector configured to receive the reflected light and measure an intensity of the reflected light and a phase of the reflected light.

公开(公告)号：US20230408401A1

公开(公告)日：2023-12-21

申请号：US18194909

申请日：2023-04-03

Applicant: Samsung Electronics Co., Ltd.

Inventor： Jaehyeon Son ,  Jinwoo Ahn ,  Juntaek Oh ,  Hankyoul Moon ,  Myungjun Lee ,  Eunsoo Hwang

IPC: G01N21/21 ,  G01J4/04 ,  G01B11/24

CPC classification number: G01N21/211 ,  G01J4/04 ,  G01B11/24 ,  G01N2021/213

Abstract: In a method of measuring an alignment error, light is incident on a surface of a reference wafer having a known polarization transmittance at the surface. An image signal is obtained from the reference wafer at a set of angles including a first combination of values of a polarizer angle and an analyzer angle. Polarization transmittance of optical equipment including a polarizer and an analyzer is calculated from the image signal of the reference wafer. Light is incident on a surface of a measurement target wafer having a structure on the surface thereof. An image signal is obtained from the measurement wafer at a set of angles including a second combination of values of the polarizer angle and the analyzer angle. At least a portion of Mueller matrix is generated from the image signal of the measurement wafer.