The utility model provides a testing apparatus for testing an insulated gate bipolar transistor module. The structure of the testing apparatus is characterized in that input terminals of a first isolated power module (2), a second isolated power module (3), and an inductance load module (4) are respectively connected with a switching power supply module (1); output terminals of the first isolated power module (2) and the second isolated power module (3) are respectively connected with a first selective switch module (6) and a second selective switch module (7); the output terminal of the inductance load module (4) is connected with a third selective switch module (8); and the first selective switch module (6), the second selective switch module (7), the third selective switch module (8), a protection circuit module (5), and an indication circuit module (10) are connected with an insulated gate bipolar transistor module (9). With the apparatus, the quality of the insulated gate bipolar transistor module can be tested conveniently. The testing apparatus has characteristics of simple and secure operation and high practicability and the like.