Invention Grant
- Patent Title: Lithographic apparatus and method
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Application No.: US14762452Application Date: 2014-02-05
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Publication No.: US10001713B2Publication Date: 2018-06-19
- Inventor: Santiago E. Del Puerto , Matthew Lipson , Kenneth C. Henderson , Raymond Wilhelmus Louis LaFarre , Louis John Markoya , Tammo Uitterdijk , Johannes Petrus Martinus Bernardus Vermeulen , Antonius Franciscus Johannes De Groot , Ronald Van Der Wilk
- Applicant: ASML Holding N.V. , ASML Netherlands B.V.
- Applicant Address: NL Veldhoven NL Veldhoven
- Assignee: ASML Holding N.V.,ASML Netherlands B.V.
- Current Assignee: ASML Holding N.V.,ASML Netherlands B.V.
- Current Assignee Address: NL Veldhoven NL Veldhoven
- Agency: Sterne, Kessler, Goldstein & Fox P.L.L.C.
- International Application: PCT/EP2014/052204 WO 20140205
- International Announcement: WO2014/122151 WO 20140814
- Main IPC: G03B27/52
- IPC: G03B27/52 ; G03F7/20 ; H01L21/67 ; H01L21/683 ; H01L21/687

Abstract:
A support such as a clamp (310) is configured to releasably hold a patterning device such as a reticle (300) to secure it and prevent heat-induced deformation of it. For example, an electrostatic clamp includes a first substrate (312) having opposing first (313) and second (315) surfaces, a plurality of burls (316) located on the first surface and configured to contact the reticle, a second substrate (314) having opposing first (317) and second (319) surfaces. The first surface of the second substrate is coupled to the second surface of the first substrate. A plurality of cooling elements (318) are located between the first surface of the second substrate and the second surface of the first substrate. The cooling elements are configured to cause electrons to travel from the second surface of the first substrate to the first surface of the second substrate. Each cooling element is substantially aligned with a respective burl.
Public/Granted literature
- US20150370180A1 Lithographic Apparatus and Method Public/Granted day:2015-12-24
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