- Patent Title: Method of detecting plasma discharge in a plasma processing system
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Application No.: US14944904Application Date: 2015-11-18
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Publication No.: US10063062B2Publication Date: 2018-08-28
- Inventor: Sergey Voronin , Alok Ranjan
- Applicant: Tokyo Electron Limited
- Applicant Address: JP Tokyo
- Assignee: Tokyo Electron Limited
- Current Assignee: Tokyo Electron Limited
- Current Assignee Address: JP Tokyo
- Agency: Oblon, McClelland, Maier & Neustadt, L.L.P.
- Main IPC: H02J4/00
- IPC: H02J4/00 ; G01R27/02 ; H01J37/32

Abstract:
Detecting presence or absence of plasma is accomplished from probe signals. In one embodiment, a low-power modulated signal is applied to an electrostatic chuck from a bias power generator. A corresponding system then monitors peak-to-peak voltage (Vpp) signal responses or radio frequency current responses. The probe signal can be generated to have insufficient power to either ignite or sustain plasma discharge (or cause component damage). Thus, low-duty and/or low current pulsing signals to be used. Presence or absence of the bulk plasma will then result in different Vpp or radio frequency current values.
Public/Granted literature
- US20160372933A1 Method of Detecting Plasma Discharge in a Plasma Processing System Public/Granted day:2016-12-22
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