Invention Grant
- Patent Title: Apparatus for on-line monitoring particle contamination in special gases
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Application No.: US15836940Application Date: 2017-12-11
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Publication No.: US10170291B1Publication Date: 2019-01-01
- Inventor: I-Hsiang Hsu , Fang-Hsin Lin , Yi-Hung Liu , Chun-Ling Chang
- Applicant: Industrial Technology Research Institute
- Applicant Address: TW Hsinchu
- Assignee: Industrial Technology Research Institute
- Current Assignee: Industrial Technology Research Institute
- Current Assignee Address: TW Hsinchu
- Agency: JCIPRNET
- Priority: TW106135875A 20171019
- Main IPC: H01J49/10
- IPC: H01J49/10 ; H01J49/04

Abstract:
An apparatus for on-line monitoring particle contamination in special gas includes a single particle inductively coupled plasma mass spectrometry (sp-ICPMS) and a gas exchange device (GED). The gas exchange device is coupled to the sp-ICPMS. The gas exchange device includes a corrosion resistant outer tube and a polytetrafluoroethylene (PTFE) inner tube. A gap is formed between the corrosion resistant outer tube and the PTFE inner tube. The length of the PTFE inner tube is 1 meter or more. The argon gas flows in the gap, and the special gas flow in the PTFE inner tube.
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