Invention Grant
- Patent Title: Calibration of semiconductor metrology systems
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Application No.: US14881847Application Date: 2015-10-13
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Publication No.: US10173249B2Publication Date: 2019-01-08
- Inventor: Jian Ding , Priya Mukundhan , James Kane , Steven Peterson , Fei Shen
- Applicant: Rudolph Technologies, Inc.
- Applicant Address: US MA Wilmington
- Assignee: Rudolph Technologies, Inc.
- Current Assignee: Rudolph Technologies, Inc.
- Current Assignee Address: US MA Wilmington
- Main IPC: B08B7/00
- IPC: B08B7/00 ; B08B7/04 ; H01L21/02 ; G01D18/00 ; H01L21/67

Abstract:
A method of cleaning calibration and other substrates that improves the correlation of measurements from calibration and product substrates and increases the useful life of the calibration substrates is herein disclosed. By exposing a calibration substrate to ultraviolet light, a reaction is triggered that results in the cleaning of the contaminants from the calibration substrate. For instance, monatomic oxygen is introduced to contaminants on the surface of a calibration substrate to remove the contaminants without inducing modifications in the substrate itself. Through the cleaning process, the temperature of the calibration substrate may be controlled to limit adverse effects caused by the overheating of the calibration substrate.
Public/Granted literature
- US20160101445A1 CALIBRATION OF SEMICONDUCTOR METROLOGY SYSTEMS Public/Granted day:2016-04-14
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