Invention Grant
- Patent Title: Memory cells and semiconductor devices including ferroelectric materials
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Application No.: US15854334Application Date: 2017-12-26
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Publication No.: US10192605B2Publication Date: 2019-01-29
- Inventor: Steven C. Nicholes , Ashonita A. Chavan , Matthew N. Rocklein
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: TraskBritt
- Main IPC: G11C11/22
- IPC: G11C11/22 ; H01L27/11502 ; G11C14/00 ; G11C11/56 ; G11C13/04 ; H01L27/11507 ; H01L49/02

Abstract:
Methods of operating a ferroelectric memory cell. The method comprises applying one of a positive bias voltage and a negative bias voltage to a ferroelectric memory cell comprising a capacitor including a top electrode, a bottom electrode, a ferroelectric material between the top electrode and the bottom electrode, and an interfacial material between the ferroelectric material and one of the top electrode and the bottom electrode. The method further comprises applying another of the positive bias voltage and the negative bias voltage to the ferroelectric memory cell to switch a polarization of the ferroelectric memory cell, wherein an absolute value of the negative bias voltage is different from an absolute value of the positive bias voltage. Ferroelectric memory cells are also described.
Public/Granted literature
- US10147474B2 Memory cells and semiconductor devices including ferroelectric materials Public/Granted day:2018-12-04
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