Invention Grant
- Patent Title: Temperature detecting circuit
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Application No.: US15054148Application Date: 2016-02-26
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Publication No.: US10203251B2Publication Date: 2019-02-12
- Inventor: Ju-An Chiang
- Applicant: Winbond Electronics Corp.
- Applicant Address: TW Taichung
- Assignee: Winbond Electronics Corp.
- Current Assignee: Winbond Electronics Corp.
- Current Assignee Address: TW Taichung
- Agency: JCIPRNET
- Priority: CN201510887196 20151204
- Main IPC: G01K7/01
- IPC: G01K7/01 ; H03K5/003 ; G05F1/46

Abstract:
A temperature detecting circuit is provided. The temperature detecting circuit includes a band gap voltage generating circuit and an offset adjusting circuit. The band gap voltage generating circuit generates a reference voltage according to a bias voltage. The band gap voltage generating circuit has a voltage dividing circuit, and the voltage dividing circuit divides the reference voltage to generate a plurality of output voltages. The offset adjusting circuit includes a current source and a resistor string. The current source provides a reference current. The resistor string receives the reference current and generates a plurality of adjusted output voltage accordingly. At least one of a current value of the reference current and a resistance of each of the resistor units is provided to be adjusted to force a voltage on an output terminal of the current source to be substantially equal to one of the reference voltage and the output voltages.
Public/Granted literature
- US20170160145A1 TEMPERATURE DETECTING CIRCUIT Public/Granted day:2017-06-08
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