Invention Grant
- Patent Title: Systems and methods for rapidly fabricating nanopatterns in a parallel fashion over large areas
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Application No.: US15534312Application Date: 2015-12-08
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Publication No.: US10207469B2Publication Date: 2019-02-19
- Inventor: Vincent M. Donnelly , Demetre J. Economou , Siyuan Tian
- Applicant: University of Houston System
- Applicant Address: US TX Houston
- Assignee: UNIVERSITY OF HOUSTON SYSTEM
- Current Assignee: UNIVERSITY OF HOUSTON SYSTEM
- Current Assignee Address: US TX Houston
- Agency: Winstead PC
- International Application: PCT/US2015/064397 WO 20151208
- International Announcement: WO2016/094353 WO 20160616
- Main IPC: B82Y30/00
- IPC: B82Y30/00 ; B29D11/00 ; G03F1/20 ; H01J37/302 ; H01J37/317 ; H01L21/027

Abstract:
Nanopantography is a method for patterning nanofeatures over large areas. Transfer of patterns defined by nanopantography using highly selective plasma etching, with an oxide layer of silicon serving as a hard mask, can improve patterning speed and etch profile. With this method, high aspect ratio features can be fabricated in a substrate with no mask undercut. The ability to fabricate complex patterns using nanopantography, followed by highly selective plasma etching, provides improved patterning speed, feature aspect ratio, and etching profile.
Public/Granted literature
- US20170361551A1 SYSTEMS AND METHODS FOR RAPIDLY FABRICATING NANOPATTERNS IN A PARALLEL FASHION OVER LARGE AREAS Public/Granted day:2017-12-21
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