Invention Grant
- Patent Title: Fin patterns with varying spacing without fin cut
-
Application No.: US15911834Application Date: 2018-03-05
-
Publication No.: US10211055B2Publication Date: 2019-02-19
- Inventor: Marc A. Bergendahl , Kangguo Cheng , John R. Sporre , Sean Teehan
- Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Tutunjian & Bitetto, P.C.
- Agent Vazken Alexanian
- Main IPC: H01L21/033
- IPC: H01L21/033 ; H01L29/66 ; H01L21/308 ; H01L21/321

Abstract:
Methods of forming semiconductor fins include forming first spacers on a first sidewall of each of multiple mandrels using an angled deposition process. A second sidewall of one or more of the mandrels is masked in a finless region. Second spacers are formed on a second sidewall of all unmasked mandrels. Semiconductor fins are formed from a substrate using the first and second spacers as a pattern mask.
Public/Granted literature
- US20180197739A1 FIN PATTERNS WITH VARYING SPACING WITHOUT FIN CUT Public/Granted day:2018-07-12
Information query
IPC分类: