Invention Grant
- Patent Title: Fin patterns with varying spacing without fin cut
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Application No.: US15908166Application Date: 2018-02-28
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Publication No.: US10217634B2Publication Date: 2019-02-26
- Inventor: Marc A. Bergendahl , Kangguo Cheng , John R. Sporre , Sean Teehan
- Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Tutunjian & Bitetto, P.C.
- Agent Vazken Alexanian
- Main IPC: H01L21/033
- IPC: H01L21/033 ; H01L29/66 ; H01L21/308 ; H01L21/321

Abstract:
Methods of forming semiconductor fins include forming first spacers on a first sidewall of each of a plurality of mandrels using a directional deposition process. A finless region is masked by forming a mask on a second sidewall of one or more of the plurality of mandrels. Second spacers are formed on a second sidewall of unmasked mandrels using a directional deposition process. The finless region is unmasked and each of the plurality of mandrels is etched away. Fins are formed from a substrate using the first and second spacers as a mask, such that no fins are formed in the finless region.
Public/Granted literature
- US20180190491A1 FIN PATTERNS WITH VARYING SPACING WITHOUT FIN CUT Public/Granted day:2018-07-05
Information query
IPC分类: