Invention Grant
- Patent Title: Measurement head for a linearly overlapping light measurement system
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Application No.: US15678288Application Date: 2017-08-16
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Publication No.: US10222255B2Publication Date: 2019-03-05
- Inventor: John P Waszak , Stephen J Waszak
- Applicant: John P Waszak , Stephen J Waszak
- Main IPC: G01J1/04
- IPC: G01J1/04 ; G01J1/42 ; G01J1/32 ; G01J3/10 ; G01N21/88 ; G01J3/50

Abstract:
A linearly-overlapping light measurement system “measurement head” having one or more linearly-overlapping modular light sources each having individual light sources arranged in a geometric pattern, the light sources being single- or multi-wavelength and programmable to generate light that is transmitted through and/or reflected from a work piece to be detected by linearly-overlapping modular light detectors having individual light detectors arranged in a geometric pattern. The “measurement head” also has linearly-overlapping modular light detectors arranged in a geometric pattern to receive light emitted by the light sources. A computer controller coordinating the operation of the light source array and light detector array to automatically sense and record the light transmittance and/or reflectance of one or more spectral ranges in real time from the work piece and then adjust the work being performed on the work piece to attain pre-determined standards. Reference feedback circuitry is provided for monitoring the light sources in each light source module. The reference feedback circuitry adjusts the operating parameters of a light source module to ensure that the intensity and the chromatic output of the light therefrom remains at a consistent level.
Public/Granted literature
- US20180073919A1 Measurement Head For A Linearly Overlapping Light Measurement System Public/Granted day:2018-03-15
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