Invention Grant
- Patent Title: Measuring device and measuring method
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Application No.: US15714016Application Date: 2017-09-25
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Publication No.: US10228285B2Publication Date: 2019-03-12
- Inventor: Tsugio Gomi
- Applicant: Seiko Epson Corporation
- Applicant Address: JP
- Assignee: Seiko Epson Corporation
- Current Assignee: Seiko Epson Corporation
- Current Assignee Address: JP
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: JP2016-190768 20160929
- Main IPC: G01J3/46
- IPC: G01J3/46 ; B41F33/00 ; G01J3/26 ; G01J3/50 ; G01J3/52

Abstract:
A measuring device is a measuring device that performs colorimetry of an evaluation patch formed on a medium and a paper white patch that is a portion exposed by the medium. The measuring device has a light source portion that irradiates the medium with an illumination light, a measurement portion that acquires an amount of light from the medium as a measurement value, a memory that holds a paper white standard value that is a reference measurement value of the paper white patch, and a colorimetry unit that corrects a measurement value of the evaluation patch based on the measurement value of the paper white patch and the paper white standard value. Even in a case where a measurement position is changed, a reflectance of the evaluation patch is accurately calculated and a chromaticity of the evaluation patch can be accurately acquired.
Public/Granted literature
- US20180087966A1 MEASURING DEVICE AND MEASURING METHOD Public/Granted day:2018-03-29
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