Invention Grant
- Patent Title: Gas measurement system
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Application No.: US15658470Application Date: 2017-07-25
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Publication No.: US10228324B2Publication Date: 2019-03-12
- Inventor: Peter Zemek , Robert M. Carangelo , Hongke Ye , Andrew Wright
- Applicant: MKS Instruments, Inc.
- Applicant Address: US MA Andover
- Assignee: MKS Instruments, Inc.
- Current Assignee: MKS Instruments, Inc.
- Current Assignee Address: US MA Andover
- Agency: Choate, Hall & Stewart LLP
- Agent William R. Haulbrook; Margo R. Monroe
- Main IPC: G01N21/39
- IPC: G01N21/39 ; G01N21/01 ; G01N33/00 ; G01N21/25

Abstract:
Presented herein are systems and methods for quantifying trace and/or ultra-trace levels of a species—for example, H2S or H2O—in a natural gas line. The systems and methods employ a tunable laser, such as a tunable diode laser, vertical-cavity surface-emitting laser (VCSEL), external cavity diode laser or a vertical external-cavity surface-emitting laser (VECSEL) or a tunable quantum cascade laser (QCL). The laser produces an output beam over a set of one or more relatively narrow, high resolution wavelength bands at a scan rate from about 0.1 Hz to about 1000 Hz. A natural gas sample comprising a trace level of a species of interest passes through a flow cell into which the output beam from the laser is guided. An optical detector receives light from the flow cell, producing a signal indicative of the absorption attenuation from which the concentration of the trace species is determined.
Public/Granted literature
- US20180024051A1 GAS MEASUREMENT SYSTEM Public/Granted day:2018-01-25
Information query
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