Invention Grant
- Patent Title: Vertical transistor with variable gate length
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Application No.: US15196774Application Date: 2016-06-29
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Publication No.: US10236214B2Publication Date: 2019-03-19
- Inventor: Kangguo Cheng , Xin Miao , Wenyu Xu , Chen Zhang
- Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
- Applicant Address: US NY Armonk
- Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
- Current Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
- Current Assignee Address: US NY Armonk
- Agency: Cantor Colburn LLP
- Agent Vazken Alexanian
- Main IPC: H01L27/00
- IPC: H01L27/00 ; H01L21/8234 ; H01L29/66 ; H01L21/02 ; H01L27/088 ; H01L29/78 ; H01L29/08

Abstract:
A method of forming a vertical transistor includes forming a first pair of fins on a substrate; forming a second pair of fins on the substrate; forming a first trench in the substrate and interposed between each one of the first pair of fins; forming a second trench in the substrate and interposed between each one of the second pair of fins, wherein the second trench is deeper than the first trench; forming a first semiconductor structure interposed between each one of the first pair of fins, the first semiconductor structure having a first gate region interposed between a first source region and a first drain region; and forming a second semiconductor structure interposed between each one of the second pair of fins, the second semiconductor structure having a first gate region interposed between a second source region and a second drain region.
Public/Granted literature
- US20180005895A1 VERTICAL TRANSISTOR WITH VARIABLE GATE LENGTH Public/Granted day:2018-01-04
Information query
IPC分类: