Invention Grant
- Patent Title: Voltage regulator having a test circuit
-
Application No.: US15465886Application Date: 2017-03-22
-
Publication No.: US10236775B2Publication Date: 2019-03-19
- Inventor: Yuji Kobayashi
- Applicant: SII Semiconductor Corporation
- Applicant Address: JP Chiba
- Assignee: ABLIC INC.
- Current Assignee: ABLIC INC.
- Current Assignee Address: JP Chiba
- Agency: Brinks Gilson & Lione
- Priority: JP2016-058854 20160323
- Main IPC: H02M3/158
- IPC: H02M3/158 ; G01R17/02 ; G01R31/40 ; H02M1/08 ; G05F1/56 ; G05F1/575 ; H02M1/00

Abstract:
To provide a voltage regulator which is capable of testing a phase compensation capacitor without impairing stability as a regulator and prevents a chip area from being increased. A voltage regulator is configured to be equipped with a phase compensation capacitance test circuit for a phase compensation circuit and a negative voltage detection circuit for an external output voltage adjustment terminal and to apply a negative voltage to the external output voltage adjustment terminal to thereby start up the phase compensation capacitance test circuit, and measure the discharge time or current of a phase compensation capacitor to thereby test whether the phase compensation capacitor is good or not.
Public/Granted literature
- US20170279358A1 VOLTAGE REGULATOR Public/Granted day:2017-09-28
Information query
IPC分类: