Invention Grant
- Patent Title: Integrated Raman spectrum measurement system
-
Application No.: US15700190Application Date: 2017-09-11
-
Publication No.: US10247674B2Publication Date: 2019-04-02
- Inventor: Chun-Ta Huang , Hsiu-Feng Tung , Wei-Hsin Wang
- Applicant: PROTRUSTECH CO., LTD
- Applicant Address: TW Tainan
- Assignee: PROTRUSTECH CO., LTD
- Current Assignee: PROTRUSTECH CO., LTD
- Current Assignee Address: TW Tainan
- Agency: JCIPRNET
- Main IPC: G01N21/65
- IPC: G01N21/65 ; G01J3/02 ; G01J3/44

Abstract:
An integrated Raman spectrum measurement system and a modularized laser module are provided. The modularized laser module includes a laser emitter and an axis adjustment mechanism. The laser emitter is configured to emit a laser beam. The axis adjustment mechanism is connected to the laser emitter and configured to adjust at least two parameters of axis and orientation of the laser emitter. A beam splitter is disposed on the path of the laser beam. A signal collection unit is for collecting at least a part of a signal light from the beam splitter, wherein the signal light is converting by an object after receiving the part of the laser beam.
Public/Granted literature
- US20170370850A1 INTEGRATED RAMAN SPECTRUM MEASUREMENT SYSTEM Public/Granted day:2017-12-28
Information query