Invention Grant
- Patent Title: Test apparatus having a probe core with a latch mechanism
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Application No.: US15108237Application Date: 2014-12-31
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Publication No.: US10254309B2Publication Date: 2019-04-09
- Inventor: John L. Dunklee , William A. Funk , Bryan J. Root
- Applicant: CELADON SYSTEMS, INC.
- Applicant Address: US MN Burnsville
- Assignee: CELADON SYSTEMS, INC.
- Current Assignee: CELADON SYSTEMS, INC.
- Current Assignee Address: US MN Burnsville
- Agency: Hamre, Schumann, Mueller & Larson, P.C.
- International Application: PCT/US2014/072943 WO 20141231
- International Announcement: WO2015/103365 WO 20150709
- Main IPC: G01R31/28
- IPC: G01R31/28 ; G01R1/067
Abstract:
A latch assembly that can lock and unlock a probe core with respect to a circuit board is provided. The latch assembly can engage with the probe core to align the probe core with respect to a circuit board, and press down the probe core against the circuit board by rotating to lock the probe core with the circuit board. An installation tool is provided to grip or release the probe core to/from a latch assembly or a probe core carrier. The installation tool can align with the probe core and/or the latch assembly to lock and unlock the probe core with respect to a circuit board.
Public/Granted literature
- US20160320428A1 TEST APPARATUS HAVING A PROBE CORE WITH A LATCH MECHANISM Public/Granted day:2016-11-03
Information query
