Invention Grant
- Patent Title: Driving device for semiconductor elements
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Application No.: US15899639Application Date: 2018-02-20
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Publication No.: US10256807B2Publication Date: 2019-04-09
- Inventor: Naoki Shimizu
- Applicant: FUJI ELECTRIC CO., LTD.
- Applicant Address: JP Kawasaki
- Assignee: FUJI ELECTRIC CO., LTD.
- Current Assignee: FUJI ELECTRIC CO., LTD.
- Current Assignee Address: JP Kawasaki
- Priority: JP2016-042239 20160304
- Main IPC: H03K17/14
- IPC: H03K17/14 ; H03K17/28 ; H03K17/56 ; H02M1/08 ; H03K17/18 ; H03K17/567 ; H03K17/08

Abstract:
To provide a driving device for semiconductor elements that is capable of suppressing variation in switching time caused by driving capability and temperature. A driving device for semiconductor elements includes: a semiconductor chip in which a voltage control type semiconductor element is formed; a temperature detecting unit configured to detect temperature of the semiconductor chip; a driving-capability adjusting unit configured to adjust driving capability of the voltage control type semiconductor element according to temperature detection values detected by the temperature detecting unit; and a timing adjusting unit configured to adjust switching time of the voltage control type semiconductor element according to the temperature detection values detected by the temperature detecting unit.
Public/Granted literature
- US20180175849A1 DRIVING DEVICE FOR SEMICONDUCTOR ELEMENTS Public/Granted day:2018-06-21
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