Invention Grant
- Patent Title: Photonic probe for atomic force microscopy
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Application No.: US15799337Application Date: 2017-10-31
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Publication No.: US10261106B2Publication Date: 2019-04-16
- Inventor: Vladimir Aksyuk , Marcelo Davanco
- Applicant: The United States of America, as represented by the Secretary of Commerce
- Applicant Address: US DC Washington
- Assignee: THE UNITED STATES OF AMERICA, AS REPRESENTED BY THE SECRETARY OF COMMERCE
- Current Assignee: THE UNITED STATES OF AMERICA, AS REPRESENTED BY THE SECRETARY OF COMMERCE
- Current Assignee Address: US DC Washington
- Agency: Office of Chief Counsel for National Institute of Standards and Technology
- Main IPC: G01Q20/02
- IPC: G01Q20/02 ; G01Q60/38 ; G01Q20/04 ; G02B6/122 ; G02B6/293 ; H01J37/317 ; H01J37/302 ; G02B6/12

Abstract:
A photonic probe for atomic force microscopy includes: a cantilever including: a tip; a wing in mechanical communication with the tip; an extension interposed between the tip and the wing to synchronously communicate motion of the tip with the wing; an optical resonator disposed proximate to the cantilever and that: receives input light; and produces output light, such that: the cantilever is spaced by a gap distance from the optical resonator, wherein the gap distance varies as the cantilever moves relative to the optical resonator, and the output light differs from the input light in response to movement of the cantilever relative to the optical resonator; an optical waveguide in optical communication with the optical resonator and that: provides the input light to the optical resonator; and receives the output light from the optical resonator.
Public/Granted literature
- US20180172728A1 PHOTONIC PROBE FOR ATOMIC FORCE MICROSCOPY Public/Granted day:2018-06-21
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