Invention Grant
- Patent Title: Detector for detecting position of IC device and method for the same
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Application No.: US15481703Application Date: 2017-04-07
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Publication No.: US10297043B2Publication Date: 2019-05-21
- Inventor: Masataka Onozawa , Aritomo Kikuchi
- Applicant: ADVANTEST CORPORATION
- Applicant Address: JP Tokyo
- Assignee: ADVANTEST CORPORATION
- Current Assignee: ADVANTEST CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Greenblum & Bernstein, P.L.C.
- Main IPC: G03F7/20
- IPC: G03F7/20 ; G06T7/73

Abstract:
An apparatus for detecting an attitude of electronic components. The electronic components include an electronic component having a plurality of terminals. The apparatus includes a storage and an image processor. The image processor is configured to: extract a binarized image from an image acquired by an imaging device; perform image matching between a terminal in the binarized image and a terminal in a model image to extract attitude candidates of image matching; obtain coordinates of a corner part of the plurality of terminals from the binarized image of the electronic component; select an attitude candidate from among the attitude candidates of image matching; and output the attitude candidate as a detected attitude of the electronic component.
Public/Granted literature
- US20180294244A1 DETECTOR FOR DETECTING POSITION OF IC DEVICE AND METHOD FOR THE SAME Public/Granted day:2018-10-11
Information query
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