A turret handler is provided. The turret handler is adapted to test an electronic element. The electronic element includes an element body and a plurality of leads. The turret handler includes a nozzle, a stage, a test block, and an abutting unit. The nozzle is adapted to hold the element body to move the electronic element. The test block is disposed on the stage. The nozzle moves the electronic element to the test block. The test block includes a coupling unit and an initiative portion. The coupling unit includes a coupling portion, a pressing portion, and an elastic structure. The elastic structure is connected to the pressing portion. The initiative portion is connected to the elastic structure.