A method is presented for forming a semiconductor structure. The method includes forming a plurality of fins over a substrate, forming one or more shallow isolation trench (STI) structures defining a first region and a second region, forming a liner dielectric and forming spacers adjacent sidewalls of the plurality of fins and adjacent the one or more STI structures. The method further includes filling the one or more STI structures with an oxide layer, and incrementally recessing the oxide layer and the spacers adjacent the plurality of fins in an alternate manner until a proximal end of the second region is detected.