Invention Grant
- Patent Title: Semiconductor device and manufacturing method thereof
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Application No.: US15878278Application Date: 2018-01-23
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Publication No.: US10312250B1Publication Date: 2019-06-04
- Inventor: Hsuan-Chun Tseng , Hsueh-Chun Hsiao , Tzu-Yun Chang , Chi-Cheng Huang , Ping-Chia Shih
- Applicant: United Microelectronics Corp.
- Applicant Address: TW Hsinchu
- Assignee: United Microelectronics Corp.
- Current Assignee: United Microelectronics Corp.
- Current Assignee Address: TW Hsinchu
- Agency: J.C. Patents
- Priority: CN201711460739 20171228
- Main IPC: H01L29/78
- IPC: H01L29/78 ; H01L21/265 ; H01L21/266 ; H01L21/311 ; H01L27/1157 ; H01L27/11524 ; H01L27/11534 ; H01L27/11573 ; H01L27/11578

Abstract:
A semiconductor device and a manufacturing method thereof are provided. The semiconductor device includes a substrate, a plurality of isolation structures, a charge storage layer, and a conductive layer. The substrate has a memory region and a logic region. The substrate in the memory region has a plurality of semiconductor fins. The isolation structures are disposed in the substrate to isolate the semiconductor fins. The semiconductor fins are protruded beyond the isolation structures. The charge storage layer covers the semiconductor fins. The conductive layer is disposed across the semiconductor fins and the isolation structures such that the charge storage layer is disposed between the conductive layer and the semiconductor fins.
Information query
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