Invention Grant
- Patent Title: Low-overhead mechanism to detect address faults in ECC-protected memories
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Application No.: US15197590Application Date: 2016-06-29
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Publication No.: US10319461B2Publication Date: 2019-06-11
- Inventor: Kon-Woo Kwon , Vivek Kozhikkottu , Dinesh Somasekhar
- Applicant: Intel Corporation
- Applicant Address: US CA Santa Clara
- Assignee: Intel Corporation
- Current Assignee: Intel Corporation
- Current Assignee Address: US CA Santa Clara
- Agency: Compass IP Law PC
- Main IPC: G11C29/00
- IPC: G11C29/00 ; G11C29/52 ; G06F11/10 ; G11C29/02 ; G11C29/42

Abstract:
Embodiments are generally directed to a low-overhead mechanism to detect address faults in ECC-protected memories. An embodiment of an apparatus includes a memory array; an error correction code (ECC) encoder for the memory array to encode ECC values based on a data value and a respective address value for the data value; and an ECC decoder for the memory array to decode ECC values that are based on data values and respective addresses for the data values; wherein the apparatus is to detect and correct an error in an address value based on an ECC value, address value, and data value stored in the memory.
Public/Granted literature
- US20180004597A1 Low-Overhead Mechanism to Detect Address Faults in ECC-Protected Memories Public/Granted day:2018-01-04
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