Invention Grant
- Patent Title: Measurement error correction method based on temperature-dependent displacement in measurement device and mass spectrometer using the same method
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Application No.: US15768174Application Date: 2015-10-16
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Publication No.: US10395906B2Publication Date: 2019-08-27
- Inventor: Shinichi Yamaguchi
- Applicant: SHIMADZU CORPORATION
- Applicant Address: JP Kyoto-shi, Kyoto
- Assignee: SHIMADZU CORPORATION
- Current Assignee: SHIMADZU CORPORATION
- Current Assignee Address: JP Kyoto-shi, Kyoto
- Agency: Sughrue Mion, PLLC
- International Application: PCT/JP2015/079253 WO 20151016
- International Announcement: WO2017/064802 WO 20170420
- Main IPC: H01J49/00
- IPC: H01J49/00 ; G01N27/62 ; H01J49/40

Abstract:
A columnar rod reference member made of a material whose coefficient of thermal expansion is different from a flight tube is placed in contact with the tube. One end of the tube and o the reference member are fixed to each other with a fixture part. A distance measurement sensor measures the difference in length between the tube and the reference member whose lengths fluctuate due to a change in temperature. A displacement of the difference in length, as expressed by a proportion, is larger than that of the length of the flight tube. The difference in length is far smaller than the length of the flight tube. This improves detection of the displacement due to thermal expansion with a strain gauge or sensor. The m/z values in mass spectrum data are corrected based on the measured values of the displacement, whereby a highly accurate mass discrepancy correction is achieved.
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