A method for measuring a three-dimensional shape includes the steps of: forming a pattern on a light irradiated to an object from a light source unit installed in an electronic device by a pattern unit installed in the electronic device; generating image data by photographing the object to which the light on which the pattern is formed is irradiated by a camera unit installed in the electronic device; generating phase data for the object using the image data, and generating, using the phase data by a data generation unit, feature value data for a feature value of the object; and determining, by a determination unit, whether the feature value data is identical to pre-stored reference value data using the feature value data and the pre-stored reference value data.