公开(公告)号：US10359276B2

公开(公告)日：2019-07-23

申请号：US15331499

申请日：2016-10-21

Applicant: KOH YOUNG TECHNOLOGY INC.

Inventor： Seung-Jun Lee ,  Kwangill Koh ,  Moon-Young Jeon ,  Sang-Kyu Yun ,  Hong-Min Kim ,  Jung Hur

IPC: G01B11/25 ,  G01B11/245 ,  H04N5/247 ,  G02B27/40

Abstract: Provided are an apparatus and a method for measuring a three dimensional shape with improved accuracy. The apparatus includes a stage, at least one lighting unit, a plurality of image pickup units and a control unit. The stage supports an object to be measured. The lighting unit includes a light source and a grid, and radiates grid-patterned light to the object to be measured. The image pickup units capture, in different directions, grid images reflected from the object to be measured. The control unit calculates a three dimensional shape of the object from the grid images captured by the image pickup units. The present invention has advantages in capturing grid images through a main image pickup portion and sub-image pickup portions, enabling the measurement of the three dimensional shape of the object in a rapid and accurate manner.

公开(公告)号：US12163776B2

公开(公告)日：2024-12-10

申请号：US17212219

申请日：2021-03-25

Applicant: KOH YOUNG TECHNOLOGY INC.

Inventor： Seung-Jun Lee ,  Kwangill Koh ,  Moon-Young Jeon ,  Sang-Kyu Yun ,  Hong-Min Kim ,  Jung Hur

IPC: G01B11/25 ,  G01B11/245 ,  H04N23/90 ,  G02B27/40

Abstract: Provided are an apparatus and a method for measuring a three dimensional shape with improved accuracy. The apparatus includes a stage, at least one lighting unit, a plurality of image pickup units and a control unit. The stage supports an object to be measured. The lighting unit includes a light source and a grid, and radiates grid-patterned light to the object to be measured. The image pickup units capture, in different directions, grid images reflected from the object to be measured. The control unit calculates a three dimensional shape of the object from the grid images captured by the image pickup units. The present invention has advantages in capturing grid images through a main image pickup portion and sub-image pickup portions, enabling the measurement of the three dimensional shape of the object in a rapid and accurate manner.

公开(公告)号：US10996050B2

公开(公告)日：2021-05-04

申请号：US16735186

申请日：2020-01-06

Applicant: KOH YOUNG TECHNOLOGY INC.

Inventor： Seung-Jun Lee ,  Kwangill Koh ,  Moon-Young Jeon ,  Sang-Kyu Yun ,  Hong-Min Kim ,  Jung Hur

IPC: G01B11/25 ,  G01B11/245 ,  H04N5/247 ,  G02B27/40

Abstract: Provided are an apparatus and a method for measuring a three dimensional shape with improved accuracy. The apparatus includes a stage, at least one lighting unit, a plurality of image pickup units and a control unit. The stage supports an object to be measured. The lighting unit includes a light source and a grid, and radiates grid-patterned light to the object to be measured. The image pickup units capture, in different directions, grid images reflected from the object to be measured. The control unit calculates a three dimensional shape of the object from the grid images captured by the image pickup units. The present invention has advantages in capturing grid images through a main image pickup portion and sub-image pickup portions, enabling the measurement of the three dimensional shape of the object in a rapid and accurate manner.

公开(公告)号：US10563978B2

公开(公告)日：2020-02-18

申请号：US15929142

申请日：2019-06-12

Applicant: KOH YOUNG TECHNOLOGY INC.

Inventor： Seung-Jun Lee ,  Kwangill Koh ,  Moon-Young Jeon ,  Sang-Kyu Yun ,  Hong-Min Kim ,  Jung Hur

IPC: G01B11/25 ,  G01B11/245 ,  H04N5/247 ,  G02B27/40

Abstract: Provided are an apparatus and a method for measuring a three dimensional shape with improved accuracy. The apparatus includes a stage, at least one lighting unit, a plurality of image pickup units and a control unit. The stage supports an object to be measured. The lighting unit includes a light source and a grid, and radiates grid-patterned light to the object to be measured. The image pickup units capture, in different directions, grid images reflected from the object to be measured. The control unit calculates a three dimensional shape of the object from the grid images captured by the image pickup units. The present invention has advantages in capturing grid images through a main image pickup portion and sub-image pickup portions, enabling the measurement of the three dimensional shape of the object in a rapid and accurate manner.

公开(公告)号：US10417472B2

公开(公告)日：2019-09-17

申请号：US15110494

申请日：2015-01-08

Applicant: KOH YOUNG TECHNOLOGY INC.

Inventor： Hyunki Lee ,  Kwangill Koh

IPC: G06K9/00 ,  G01B9/02 ,  G01B11/25 ,  G06F21/32 ,  G06T7/521 ,  G06T7/586

Abstract: A method for measuring a three-dimensional shape includes the steps of: forming a pattern on a light irradiated to an object from a light source unit installed in an electronic device by a pattern unit installed in the electronic device; generating image data by photographing the object to which the light on which the pattern is formed is irradiated by a camera unit installed in the electronic device; generating phase data for the object using the image data, and generating, using the phase data by a data generation unit, feature value data for a feature value of the object; and determining, by a determination unit, whether the feature value data is identical to pre-stored reference value data using the feature value data and the pre-stored reference value data.