- Patent Title: Terahertz detection sensor and terahertz image measurement device
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Application No.: US16062609Application Date: 2016-12-14
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Publication No.: US10436632B2Publication Date: 2019-10-08
- Inventor: Yukio Kawano
- Applicant: TOKYO INSTITUTE OF TECHNOLOGY
- Applicant Address: JP Tokyo
- Assignee: TOKYO INSTITUTE OF TECHNOLOGY
- Current Assignee: TOKYO INSTITUTE OF TECHNOLOGY
- Current Assignee Address: JP Tokyo
- Agency: Maschoff Brennan
- Priority: JP2015-244218 20151215
- International Application: PCT/JP2016/087196 WO 20161214
- International Announcement: WO2017/104697 WO 20170622
- Main IPC: G01J1/02
- IPC: G01J1/02 ; G01Q60/22 ; G01N21/3581

Abstract:
A terahertz image measurement device includes a terahertz detection sensor, a magnetic field generating unit, and a measurement control unit. The sensor detects near-field light of terahertz light emitted from a sample. The magnetic field generating unit has a coil disposed around the sample and the sensor, and wound to surround the optical axis of terahertz light irradiated on the sensor, and applies to the sensor a magnetic field generated by allowing an electric current to flow through the coil. The measurement control unit changes a value of the electric current flowing through the coil, sets a strength of the magnetic field to a magnetic field value for which a detection signal level of the terahertz light detected by the sensor increases prominently, and allows the magnetic field value to conform to a specific frequency of the terahertz light.
Public/Granted literature
- US20180364094A1 TERAHERTZ DETECTION SENSOR AND TERAHERTZ IMAGE MEASUREMENT DEVICE Public/Granted day:2018-12-20
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