The invention relates to a characterization device (50) for characterizing a sample (S) comprising: a memory (MEM) storing a measured spectrum (As+p) of said sample, performed through a translucent material, and a measured spectrum of the translucent material (Ap), a processing unit (PU) configured to: determine a spectral energy (Es+p) of the measured spectrum (As+p) of the sample through the translucent material (As+p), estimate a coefficient ({circumflex over (γ)}) from said spectral energy (Es+p) and, determine a corrected spectrum (Âs) of the sample from the measured spectrum (As+p) of the sample through the translucent material and from a corrected spectrum of the translucent material (Âp), said corrected spectrum of the translucent material (Âp) being determined from the measured spectrum of the translucent material (Ap) and from the estimated coefficient ({circumflex over (γ)}).