公开(公告)号：US11619547B2

公开(公告)日：2023-04-04

申请号：US17277905

申请日：2019-09-25

Applicant: GREENTROPISM

Inventor： Pierre Gauvain ,  Anthony Boulanger

IPC: G01J3/02 ,  G01J3/42 ,  G01J3/28 ,  H01J49/02

Abstract: A system for remote-controlling a spectrometer, which includes: at least one spectrometry device including a spectrometer and auxiliary modules, the spectrometry device being configured to measure spectrometry data on an object and/or a process; a control device configured to control the spectrometry device, the control device including an element for controlling the spectrometry device, an element for acquiring and processing the spectrometry data, and an element for remote communication; and at least one interface modules configured to communicate with the control device remotely. The remote-control device is configured to communicate with the interface module via Internet, and the spectrometry device is interchangeable. Also, a device for remote-controlling a spectrometry system that is configured to be used in a system for remote-controlling the spectrometer.

公开(公告)号：US10444142B2

公开(公告)日：2019-10-15

申请号：US15946887

申请日：2018-04-06

Applicant: GREENTROPISM

Inventor： Antoine Laborde ,  Aude Bourdeau ,  Anthony Boulanger

IPC: G01N21/31 ,  G01J3/28 ,  G01J3/42 ,  G01N33/10 ,  G01N21/27 ,  G01J3/02

Abstract: The invention relates to a characterization device (50) for characterizing a sample (S) comprising: a memory (MEM) storing a measured spectrum (As+p) of said sample, performed through a translucent material, and a measured spectrum of the translucent material (Ap), a processing unit (PU) configured to: determine a spectral energy (Es+p) of the measured spectrum (As+p) of the sample through the translucent material (As+p), estimate a coefficient ({circumflex over (γ)}) from said spectral energy (Es+p) and, determine a corrected spectrum (Âs) of the sample from the measured spectrum (As+p) of the sample through the translucent material and from a corrected spectrum of the translucent material (Âp), said corrected spectrum of the translucent material (Âp) being determined from the measured spectrum of the translucent material (Ap) and from the estimated coefficient ({circumflex over (γ)}).