Invention Grant
- Patent Title: Alignment sensor for lithographic apparatus
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Application No.: US15756057Application Date: 2016-08-23
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Publication No.: US10466601B2Publication Date: 2019-11-05
- Inventor: Alessandro Polo , Simon Gijsbert Josephus Mathijssen , Patricius Aloysius Jacobus Tinnemans , Scott Douglas Coston , Ronan James Havelin
- Applicant: ASML Netherlands B.V. , ASML Holding N.V.
- Applicant Address: NL Veldhoven NL Veldhoven
- Assignee: ASML Netherlands B.V.,ASML Holding N.V.
- Current Assignee: ASML Netherlands B.V.,ASML Holding N.V.
- Current Assignee Address: NL Veldhoven NL Veldhoven
- Agency: Pillsbury Winthrop Shaw Pittman LLP
- International Application: PCT/EP2016/069876 WO 20160823
- International Announcement: WO2017/045874 WO 20170323
- Main IPC: G03F7/20
- IPC: G03F7/20 ; G03F9/00 ; G02B6/293 ; G02B27/10 ; G02B27/14

Abstract:
A lithographic apparatus includes an alignment sensor configured to determine the position of an alignment target having a periodic structure. The alignment sensor includes a demultiplexer to demultiplex a number of intensity channels. The demultiplexer includes a number of stages arranged in series and a number of demultiplexing components, each demultiplexing component operable to divide an input radiation beam into two radiation beam portions. The first stage has a first demultiplexing component that is arranged to receive as an input radiation beam an incident radiation beam. Each successive stage is arranged such that it has twice the number of demultiplexing components as a preceding stage, each demultiplexing component of each stage after the first stage receiving as an input one of the radiation beam portions output from a demultiplexing component of the preceding stage.
Public/Granted literature
- US20180329316A1 ALIGNMENT SENSOR FOR LITHOGRAPHIC APPARATUS Public/Granted day:2018-11-15
Information query
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