Invention Grant
- Patent Title: Spectral CT systems and methods
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Application No.: US15538376Application Date: 2015-12-22
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Publication No.: US10548543B2Publication Date: 2020-02-04
- Inventor: Ge Wang , Yan Xi , Wenxiang Cong , Zaifeng Shi
- Applicant: RENSSELAER POLYTECHNIC INSTITUTE
- Applicant Address: US NY Troy
- Assignee: Rensselaer Polytechnic Institute
- Current Assignee: Rensselaer Polytechnic Institute
- Current Assignee Address: US NY Troy
- Agency: Murtha Cullina LLP
- International Application: PCT/US2015/067441 WO 20151222
- International Announcement: WO2016/106348 WO 20160630
- Main IPC: A61B6/00
- IPC: A61B6/00 ; A61B6/03 ; G01T1/29

Abstract:
Novel and advantageous methods and systems for performing spectral computed tomography are provided. An edge-on detector, such as a silicon strip detector, can be used to receive X-rays after passing through a sample to be imaged. An energy resolving process can be performed on the collected X-ray radiation. The CT scanner can have third-generation or fourth-generation geometry.
Public/Granted literature
- US20170360385A1 NOVEL SPECTRAL CT SYSTEMS AND METHODS Public/Granted day:2017-12-21
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