Invention Grant
- Patent Title: Sample observation apparatus and method for generating observation image of sample
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Application No.: US14728396Application Date: 2015-06-02
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Publication No.: US10552945B2Publication Date: 2020-02-04
- Inventor: Hisao Kitagawa , Yusuke Yamashita , Yasunari Matsukawa
- Applicant: OLYMPUS CORPORATION
- Applicant Address: JP Tokyo
- Assignee: OLYMPUS CORPORATION
- Current Assignee: OLYMPUS CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Holtz, Holtz & Volek PC
- Priority: JP2014-126228 20140619
- Main IPC: G06T3/40
- IPC: G06T3/40 ; G06T7/00 ; G02B21/36 ; G02B21/00 ; G02B27/58 ; G01N21/64

Abstract:
A sample observation apparatus includes a memory and a main controller. The main controller stores a first number of photoelectrons required in a raw image for generating a super-resolution image. The main controller calculates the number of image data sets to be added together for generating the raw image based on the first number of photoelectrons stored in the memory and a predetermined image acquisition condition, acquires multiple sets of image data of the same region of a sample by repeatedly detecting light from the same region based on the calculated number of image data sets, and generates the raw image by adding together the acquired multiple sets of image data of the same region.
Public/Granted literature
- US20150371368A1 SAMPLE OBSERVATION APPARATUS AND METHOD FOR GENERATING OBSERVATION IMAGE OF SAMPLE Public/Granted day:2015-12-24
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