Invention Grant
- Patent Title: Read disturb scan consolidation
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Application No.: US16175657Application Date: 2018-10-30
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Publication No.: US10553290B1Publication Date: 2020-02-04
- Inventor: Kishore Kumar Muchherla , Ashutosh Malshe , Harish R. Singidi , Shane Nowell , Vamsi Pavan Rayaprolu , Sampath K. Ratnam
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Lowenstein Sandler LLP
- Main IPC: G11C16/26
- IPC: G11C16/26 ; G11C16/34 ; G11C29/52 ; G11C29/42 ; G06F11/30 ; G06F11/10

Abstract:
A processing device in a memory system determines that a first read count of a first data block on a first plane of a memory component satisfies a first threshold criterion. The processing device further determines whether a second read count of a second data block on a second plane of the memory component satisfies a second threshold criterion, wherein the second block is associated with the first block, and wherein the second threshold criterion is lower than the first threshold criterion. Responsive to the second read count satisfying the second threshold criterion, the processing device performs a multi-plane scan to determine a first error rate for the first data block and a second error rate for the second data block in parallel.
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