Invention Grant
- Patent Title: Automatic analysis device and separation and washing method
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Application No.: US15520228Application Date: 2015-09-29
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Publication No.: US10562039B2Publication Date: 2020-02-18
- Inventor: Mizuki Nakamura , Tomohiro Endo , Kazuyuki Oguri
- Applicant: JEOL Ltd. , Fujirebio Inc.
- Applicant Address: JP Tokyo JP Tokyo
- Assignee: JEOL Ltd.,Fujirbio Inc.
- Current Assignee: JEOL Ltd.,Fujirbio Inc.
- Current Assignee Address: JP Tokyo JP Tokyo
- Agency: The Webb Law Firm
- Priority: JP2014-217310 20141024
- International Application: PCT/JP2015/077604 WO 20150929
- International Announcement: WO2016/063690 WO 20160428
- Main IPC: B03C1/02
- IPC: B03C1/02 ; G01B11/25 ; G01B11/30 ; G01N21/89 ; G01N35/00 ; G01N35/02 ; G01N35/10 ; B03C1/00 ; G01N35/04 ; G01N33/543 ; G01N1/34 ; G01N1/40

Abstract:
An automatic analysis device and method having a BF separation process, wherein the width in a container conveyance direction of a surface facing a reaction container of a magnet for preliminary magnetic collection of a first magnetic generation part (32p) is set to have a length including a region for housing a liquid sample of the reaction container conveyed to a magnetic collection position of the first magnetic generation part. An end in the container conveyance direction of a surface facing the reaction container of a magnet for regular magnetic collection of a second magnetic generation part (32m) is designed to be close to the center of the region for housing the liquid sample of the reaction container conveyed to a magnetic collection position of the second magnetic generation part.
Public/Granted literature
- US20170312756A1 Automatic Analysis Device and Separation and Washing Method Public/Granted day:2017-11-02
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