Invention Grant
- Patent Title: Security inspection apparatus and method
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Application No.: US15826530Application Date: 2017-11-29
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Publication No.: US10571598B2Publication Date: 2020-02-25
- Inventor: Jianhong Zhang , Nei Yang , Hongqiu Wang , Yumin Yi , Hu Tang , Guohua Wei
- Applicant: Nuctech Company Limited
- Applicant Address: CN Beijing
- Assignee: Nuctech Company Limited
- Current Assignee: Nuctech Company Limited
- Current Assignee Address: CN Beijing
- Agency: Knobbe, Martens, Olson & Bear, LLP
- Priority: CN201611208515 20161223
- Main IPC: G01J3/44
- IPC: G01J3/44 ; G01V5/00 ; G01N21/65 ; G01N23/046

Abstract:
A security inspection apparatus and a security inspection method are disclosed. In one aspect, an example apparatus includes a CT inspection device and a Raman spectrum inspection device, the CT inspection device includes: a CT scanner scanning an object to be inspected to generate a CT image, an image recognizing device recognizing the CT image to check whether or not the object has a suspected hazardous article, and an object marking device making a predetermined marker on the object which has the suspected hazardous article. The Raman spectrum inspection device includes: a Raman spectrum measuring device extracting a Raman spectrum of the suspected hazardous article in the object, a Raman spectrum comparing device comparing the Raman spectrum of the suspected hazardous article with Raman spectra of known compositions to determine a composition of the suspected hazardous article, and an object marker recognizing device recognizing the predetermined marker on the object.
Public/Granted literature
- US20180180761A1 SECURITY INSPECTION APPARATUS AND METHOD Public/Granted day:2018-06-28
Information query