Invention Grant
- Patent Title: Magnetic field measurement apparatus and method for noise environment
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Application No.: US15645433Application Date: 2017-07-10
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Publication No.: US10575738B2Publication Date: 2020-03-03
- Inventor: Takeshi Tanaka , Yuji Ogata , Yoshiyuki Hata , Toshiaki Hayakawa , Tomoaki Ueda
- Applicant: ADVANTEST CORPORATION
- Applicant Address: JP Tokyo
- Assignee: ADVANTEST COPORATION
- Current Assignee: ADVANTEST COPORATION
- Current Assignee Address: JP Tokyo
- Priority: JP2016-138447 20160713
- Main IPC: A61B5/04
- IPC: A61B5/04 ; A61B5/00 ; G01R33/00 ; A61B5/0265 ; A61B5/024 ; G01F1/56 ; G01R15/14 ; G01R33/022 ; A61B5/18

Abstract:
In a magnetic field measurement apparatus and a magnetic field measurement method provided herein, a magnetic field from an object is measured by a magnetic sensor group including a plurality of magnetic sensors. Then, an estimated value of a common noise component included in observed quantities of the magnetic sensors of all the channels of the magnetic sensor group is obtained as an external magnetic noise component. Finally the magnetic signal from the object is calculated by subtracting the estimated value from the observed quantity of each of the magnetic sensors.
Public/Granted literature
- US20180014738A1 MAGNETIC FIELD MEASUREMENT APPARATUS AND METHOD FOR NOISE ENVIRONMENT Public/Granted day:2018-01-18
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