- Patent Title: Sample analysis system, display method, and sample analysis method
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Application No.: US16193021Application Date: 2018-11-16
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Publication No.: US10585041B2Publication Date: 2020-03-10
- Inventor: Jun Horigome , Masaki Watanabe , Katsutoshi Shimizu , Hideyuki Sakamoto
- Applicant: Hitachi High-Tech Science Corporation
- Applicant Address: JP Minato-ku, Tokyo
- Assignee: Hitachi High-Tech Science Corporation
- Current Assignee: Hitachi High-Tech Science Corporation
- Current Assignee Address: JP Minato-ku, Tokyo
- Agency: Banner & Witcoff, Ltd.
- Priority: JP2017-221933 20171117
- Main IPC: G01N21/64
- IPC: G01N21/64 ; G01N30/24 ; G01N30/74 ; H01J49/00 ; G01N30/86 ; G01N30/02

Abstract:
A sample analysis system includes a Fluorescence Spectrophotometer, a liquid chromatography device, a mass spectrometer, a control device, and a sample introducer. The Fluorescence Spectrophotometer obtains a three-dimensional fluorescence spectrum including an excitation wavelength, a fluorescence wavelength, and a fluorescence intensity. The liquid chromatography device obtains a three-dimensional absorption spectrum including an elution time, an absorption wavelength, and an absorbance. The mass spectrometer obtains a three-dimensional mass spectrum including an elution time, mass information, and an ion intensity. The axes of respective spectra are set on the same scale, and the mass-charge ratio in the three-dimensional mass spectrum data obtained by the mass spectrometer is determined.
Public/Granted literature
- US20190154579A1 Sample Analysis System, Display Method, and Sample Analysis Method Public/Granted day:2019-05-23
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