Invention Grant
- Patent Title: Inspecting device, inspecting method, and program
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Application No.: US16339510Application Date: 2017-10-26
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Publication No.: US10585045B2Publication Date: 2020-03-10
- Inventor: Yoshinori Konishi
- Applicant: OMRON Corporation
- Applicant Address: JP Kyoto-shi
- Assignee: OMRON Corporation
- Current Assignee: OMRON Corporation
- Current Assignee Address: JP Kyoto-shi
- Agency: Metrolex IP Law Group, PLLC
- Priority: JP2016-243248 20161215
- International Application: PCT/JP2017/038687 WO 20171026
- International Announcement: WO2018/110112 WO 20180621
- Main IPC: G01N21/88
- IPC: G01N21/88 ; G01J1/44 ; G02F1/13 ; G06T7/00 ; G06T1/00 ; G01M11/00 ; F21S2/00

Abstract:
An inspecting device includes: an image acquiring unit which acquires a light-emitting surface image as a photographed image of the light-emitting surface; an inspecting unit which sets an inspecting range in a position of the light-emitting surface image in which the failure may appear, detects, from the inspecting range, a bright region which is brighter than a lower limit threshold value, calculates an evaluation value evaluating both the size and luminance of the bright region, and determines the presence or absence of the failure on the basis of the evaluation value; and an output unit which outputs information obtained by the inspecting unit.
Public/Granted literature
- US20190285554A1 INSPECTING DEVICE, INSPECTING METHOD, AND PROGRAM Public/Granted day:2019-09-19
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