Invention Grant
- Patent Title: Method and device for detecting charged particles
-
Application No.: US15359623Application Date: 2016-11-23
-
Publication No.: US10605755B2Publication Date: 2020-03-31
- Inventor: Yi-Sheng Wang
- Applicant: Academia Sinica
- Applicant Address: TW Taipei
- Assignee: Academia Sinica
- Current Assignee: Academia Sinica
- Current Assignee Address: TW Taipei
- Main IPC: G01N27/02
- IPC: G01N27/02 ; H01J37/00 ; G01N1/00 ; G01N15/00

Abstract:
The present invention relates to a device for detecting charged particles (e.g., ions). The device includes components arranged to neutralize or strip the charges of ions generated from a sample material, in which the charge stripping events produce signals that can be detected subsequently by a detector. A method for detecting charged particles generated from a sample material using the device is also provided.
Public/Granted literature
- US20170153195A1 METHOD AND DEVICE FOR DETECTING CHARGED PARTICLES Public/Granted day:2017-06-01
Information query