Invention Grant
- Patent Title: Optical analysis device and optical analysis method
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Application No.: US16095263Application Date: 2017-04-19
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Publication No.: US10648910B2Publication Date: 2020-05-12
- Inventor: Yuta Yamanoi , Tomomi Setoguchi , Yoshitaka Teraoka
- Applicant: KONICA MINOLTA, INC.
- Applicant Address: JP Tokyo
- Assignee: Konica Minolta, Inc.
- Current Assignee: Konica Minolta, Inc.
- Current Assignee Address: JP Tokyo
- Agency: Cozen O'Connor
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@313cd247
- International Application: PCT/JP2017/015719 WO 20170419
- International Announcement: WO2017/188085 WO 20171102
- Main IPC: G01N21/57
- IPC: G01N21/57 ; G01J3/02 ; G01J3/50 ; G01N21/25 ; G01N21/956 ; C09D201/00 ; C09D5/36 ; G01N21/84

Abstract:
A difference between a peak reflectance of a first wavelength component and a reflectance of a second wavelength component having a predetermined wavelength among reflectances of a plurality of wavelength components constituting reflected light in a highlight direction from a glitter material-containing coating film is set as a first difference value. Reflectance is measured of the first and second wavelength components of the reflected light in the highlight direction for the coating film corresponding to a measurement object. A first difference value is calculated by using the measurement result. A storage stores in advance correlation information indicating a correlation between the first difference value and an index value indicating predetermined physical characteristics of a glitter material contained in the coating film. An index value calculator calculates the index value of the coating film corresponding to the measurement object by using the correlation information and the first difference value calculated in the first calculator.
Public/Granted literature
- US20190293560A1 Optical Analysis Device And Optical Analysis Method Public/Granted day:2019-09-26
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