Invention Grant
- Patent Title: Apparatus and methods for accurate latency measurements in integrated circuits
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Application No.: US15392427Application Date: 2016-12-28
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Publication No.: US10649486B1Publication Date: 2020-05-12
- Inventor: Hartvig Ekner , Dines Justesen , Daniel A. Temple
- Applicant: INTEL CORPORATION
- Applicant Address: US CA Santa Clara
- Assignee: Intel Corporation
- Current Assignee: Intel Corporation
- Current Assignee Address: US CA Santa Clara
- Main IPC: G06F1/14
- IPC: G06F1/14

Abstract:
One embodiment relates to a method of performing a latency measurement within an integrated circuit. Receipt of a word that contains a beginning of a frame is detected by a frame begin detect circuit in a decoding circuit block. A begin frame detected signal is fed back to the physical media attachment circuit, and an asynchronous signal from the physical media attachment circuit is transmitted at a beginning of a subsequent frame to a time measurement circuit in a core of the integrated circuit. A bitcount may be used to generate a synchronous signal that is also transmitted to the core. At the core of the integrated circuit, a first time is measured that corresponds to receipt of the asynchronous signal and a second time is measured that corresponds to receipt of the synchronous signal. A latency is determined at least by subtracting the first time subtracted from the second time. Other embodiments and features are also disclosed.
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